Investigation of CdS passivation layers on HgxCd1-xTe (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Investigation of CdS passivation layers on HgxCd1-xTe (Articolo in rivista) (literal)

Anno

• 1994-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1002/sia.740220144 (literal)

Alternative label

• S. Kaciulis, G. Mattogno, S. Viticoli, M.E. Marini, F. Cesqui, S. Alfuso, A. Mercuri (1994)
  Investigation of CdS passivation layers on HgxCd1-xTe
  in SIA. Surface and interface analysis
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• S. Kaciulis, G. Mattogno, S. Viticoli, M.E. Marini, F. Cesqui, S. Alfuso, A. Mercuri (literal)

Pagina inizio

• 197 (literal)

Pagina fine

• 201 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 22 (literal)

Rivista

• SIA. Surface and interface analysis (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• CNR, IST CHIM MAT, CP 10, I-00016 ROME, ITALY, ALENIA, I-00131 ROME, ITALY (literal)

Titolo

• Investigation of CdS passivation layers on HgxCd1-xTe (literal)

Abstract

• CdS thin films were deposited on sapphire substrates and on the HgxCd1-xTe epitaxial and single crystal samples by using chemical decomposition on thiourea and anodic non-aqueous sulphidation techniques, respectively. The chemical composition and depth profiles of deposited films were investigated by selected area XPS combined with Ar+ ion sputtering. Lateral homogeneity of CdS films was studied by using scanning Auger microscopy. Nearly stoichiometric CdS films were obtained on sapphire and HgxCe1-xTe. The thickness, chemical composition and sputtering rate at 2 keV ion energy were determined from XPS data. In both cases (either deposited on sapphire or on HgxCd1-xTe) the CdS films were found to be very non-homogeneous in thickness. (literal)

Prodotto di

• Istituto per lo studio dei materiali nanostrutturati (ISMN) (Istituto)

Autore CNR

• SESTO VITICOLI (Persona)
• SAULIUS KACIULIS (Persona)

Insieme di parole chiave

• Parole chiave di "Investigation of CdS passivation layers on HgxCd1-xTe" (Insieme di parole chiave)

Incoming links:

Prodotto

• Istituto per lo studio dei materiali nanostrutturati (ISMN) (Istituto)

Autore CNR di

• SAULIUS KACIULIS (Persona)
• SESTO VITICOLI (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• SIA. Surface and interface analysis (Rivista)

Insieme di parole chiave di

• Parole chiave di "Investigation of CdS passivation layers on HgxCd1-xTe" (Insieme di parole chiave)