GeO2 based high k dielectric material synthesized by sol-gel process (Articolo in rivista)

Type
Label
  • GeO2 based high k dielectric material synthesized by sol-gel process (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • Phani, AR; Di Claudio, D; Passacantando, M; Santucci, S (2007)
    GeO2 based high k dielectric material synthesized by sol-gel process
    in Journal of non-crystalline solids
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Phani, AR; Di Claudio, D; Passacantando, M; Santucci, S (literal)
Pagina inizio
  • 692 (literal)
Pagina fine
  • 696 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 353 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Univ Aquila, Dipartimento Fis, CASTI, CNR,INFM Reg Lab, I-67010 Coppito, Laquila, Italy (literal)
Titolo
  • GeO2 based high k dielectric material synthesized by sol-gel process (literal)
Abstract
  • Recently, there has been lot of research on new high dielectric constant (high k) materials for use in future generations of ultra-large scale integrated circuits (ULSI). There are number of requirements for the new high k materials, such as high dielectric constant, thermal stability (400 degrees C or higher), high mechanical strength, and good adhesion to neighboring layers. Keeping in view the properties required for the replacement of existing SiO2 dielectrics, new high k dielectric material based on GeO2 has been synthesized. Polycrystalline GeO2 thin films have been deposited by simple, and cost effective sol-gel spin coating process. The obtained xerogel films of germanium oxide have been annealed at 400 degrees C, 600 degrees C and 800 degrees C for 3 h in argon atmosphere. Elemental composition, morphology, and phase analysis have been measured by employing X-ray photoelectron spectroscopy, scanning electron microscopy, and X-ray diffraction techniques, respectively. The formation of the hexagonal GeO2 phase at and above 400 degrees C has been reported. The composition of the annealed films have been measured and found to be 68 at.% of O, 32 at.% of Ge for GeO2, which are close to the stoichiometry of the GeO2. (c) 2007 Elsevier B.V. All rights reserved. (literal)
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