Contact effects in high performance fully printed p-channel organic thin film transistors (Articolo in rivista)

Type
Label
  • Contact effects in high performance fully printed p-channel organic thin film transistors (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.3669701 (literal)
Alternative label
  • A. Valletta, A. Daami, M. Benwadih, R. Coppard, G. Fortunato, M. Rapisarda, F. Torricelli, and L. Mariucci (2011)
    Contact effects in high performance fully printed p-channel organic thin film transistors
    in Applied physics letters
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • A. Valletta, A. Daami, M. Benwadih, R. Coppard, G. Fortunato, M. Rapisarda, F. Torricelli, and L. Mariucci (literal)
Pagina inizio
  • 233309-1 (literal)
Pagina fine
  • 233309-4 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 99 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 4 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR-IMM; CEA/LITEN/LCI; Eindhoven University of Technology (literal)
Titolo
  • Contact effects in high performance fully printed p-channel organic thin film transistors (literal)
Abstract
  • Contact effects have been investigated in fully printed p-channel organic thin film transistors with field effect mobility up to 2 cm2/Vs. Electrical characteristics of the organic thin film transistors, with channel length <200 lm, are seriously influenced by contact effects with an anomalous increase of the contact resistance for increasing source-drain voltage. Assuming that contact effects are negligible in long channel transistors and using gradual channel approximation, we evaluated the current-voltage characteristics of the injection contact, showing that I-V characteristics can be modeled as a reverse biased Schottky diode, including barrier lowering induced by the Schottky effect. (literal)
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