http://www.cnr.it/ontology/cnr/individuo/prodotto/ID211037
Contact effects in high performance fully printed p-channel organic thin film transistors (Articolo in rivista)
- Type
- Label
- Contact effects in high performance fully printed p-channel organic thin film transistors (Articolo in rivista) (literal)
- Anno
- 2011-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1063/1.3669701 (literal)
- Alternative label
A. Valletta, A. Daami, M. Benwadih, R. Coppard, G. Fortunato, M. Rapisarda, F. Torricelli, and L. Mariucci (2011)
Contact effects in high performance fully printed p-channel organic thin film transistors
in Applied physics letters
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- A. Valletta, A. Daami, M. Benwadih, R. Coppard, G. Fortunato, M. Rapisarda, F. Torricelli, and L. Mariucci (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR-IMM;
CEA/LITEN/LCI;
Eindhoven University of Technology (literal)
- Titolo
- Contact effects in high performance fully printed p-channel organic thin film transistors (literal)
- Abstract
- Contact effects have been investigated in fully printed p-channel organic thin film transistors with
field effect mobility up to 2 cm2/Vs. Electrical characteristics of the organic thin film transistors,
with channel length <200 lm, are seriously influenced by contact effects with an anomalous
increase of the contact resistance for increasing source-drain voltage. Assuming that contact effects
are negligible in long channel transistors and using gradual channel approximation, we evaluated
the current-voltage characteristics of the injection contact, showing that I-V characteristics can be
modeled as a reverse biased Schottky diode, including barrier lowering induced by the Schottky
effect. (literal)
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- Autore CNR
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