http://www.cnr.it/ontology/cnr/individuo/prodotto/ID207747
Electronic transport signatures of common defects in irradiated graphene-based systems (Articolo in rivista)
- Type
- Label
- Electronic transport signatures of common defects in irradiated graphene-based systems (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.nimb.2011.08.052 (literal)
- Alternative label
Deretzis I, Piccitto G, La Magna A (2012)
Electronic transport signatures of common defects in irradiated graphene-based systems
in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (Print)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Deretzis I, Piccitto G, La Magna A (literal)
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- http://www.sciencedirect.com/science/article/pii/S0168583X11008445# (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- [ 1 ] Ist Microelettron & Microsistemi CNR IMM, I-95121 Catania, Italy
[ 2 ] Univ Catania, Dipartimento Fis & Astron, I-95123 Catania, Italy (literal)
- Titolo
- Electronic transport signatures of common defects in irradiated graphene-based systems (literal)
- Abstract
- Ion irradiation of a graphene sheet can give rise to a wide range of point and extended defects on the ideal honeycomb lattice. Here we perform first-principles calculations for the determination of the electronic and transport properties of damaged graphene nanoribbons based on nonequilibrium Green function techniques. Considering a wide range of defects (vacancies, di-vacancies, Stone-Wales, sp(3)-type) we study the conductive characteristics, showing that the common feature in all cases is the presence of transport gaps induced by local perturbations of the wavefunction around the defected areas. However, the resonances of these pseudogaps are intrinsically related to the defect type, making possible a structural characterization of a defected graphene system based on its electrical behavior. (literal)
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