http://www.cnr.it/ontology/cnr/individuo/prodotto/ID207713
Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces (Articolo in rivista)
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- Label
- Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces (Articolo in rivista) (literal)
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- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1021/jp3042318 (literal)
- Alternative label
Grazianetti C, Molle A, Tallarida G, Spiga S, Fanciulli M (2012)
Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces
in Journal of physical chemistry. C
(literal)
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- Grazianetti C, Molle A, Tallarida G, Spiga S, Fanciulli M (literal)
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- [ 1 ] IMM CNR, Lab MDM, I-20864 Agrate Brianza, MB, Italy
[ 2 ] Univ Milano Bicocca, Dipartimento Sci Mat, I-20126 Milan, Italy (literal)
- Titolo
- Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces (literal)
- Abstract
- The role played by electric dipoles at the interface Al2O3/In0.53Ga0.47As(001) has been investigated in a whole in situ approach by means of scanning tunneling microscopy/spectroscopy and X-ray photoelectron spectroscopy (XPS) in order to study local and macroscopic features, respectively. The initial pinned Fermi level (FL) shifts toward midgap after oxide deposition in both (2 x 4) and (4 x 2) reconstructions, while a reconstruction-dependent FL restoring is observed after annealing at 200 degrees C. This behavior is rationalized in terms of formation and suppression of positive charge in the as-grown oxide resulting from in situ XPS of the interface band line up. (literal)
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