Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces (Articolo in rivista)

Type
Label
  • Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1021/jp3042318 (literal)
Alternative label
  • Grazianetti C, Molle A, Tallarida G, Spiga S, Fanciulli M (2012)
    Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces
    in Journal of physical chemistry. C
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Grazianetti C, Molle A, Tallarida G, Spiga S, Fanciulli M (literal)
Pagina inizio
  • 18746 (literal)
Pagina fine
  • 18751 (literal)
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  • 116 (literal)
Rivista
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  • 6 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 35 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • [ 1 ] IMM CNR, Lab MDM, I-20864 Agrate Brianza, MB, Italy [ 2 ] Univ Milano Bicocca, Dipartimento Sci Mat, I-20126 Milan, Italy (literal)
Titolo
  • Effect of Electric Dipoles on Fermi Level Positioning at the Interface between Ultrathin Al2O3 Films and Differently Reconstructed In0.53Ga0.47As(001) Surfaces (literal)
Abstract
  • The role played by electric dipoles at the interface Al2O3/In0.53Ga0.47As(001) has been investigated in a whole in situ approach by means of scanning tunneling microscopy/spectroscopy and X-ray photoelectron spectroscopy (XPS) in order to study local and macroscopic features, respectively. The initial pinned Fermi level (FL) shifts toward midgap after oxide deposition in both (2 x 4) and (4 x 2) reconstructions, while a reconstruction-dependent FL restoring is observed after annealing at 200 degrees C. This behavior is rationalized in terms of formation and suppression of positive charge in the as-grown oxide resulting from in situ XPS of the interface band line up. (literal)
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