Digital holographic microscopy characterization of superdirective beam by metamaterial (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Digital holographic microscopy characterization of superdirective beam by metamaterial (Articolo in rivista) (literal)

Anno

• 2012-01-01T00:00:00+01:00 (literal)

Alternative label

• Di Caprio G, Dardano P, Coppola G, Cabrini S, Mocella V (2012)
  Digital holographic microscopy characterization of superdirective beam by metamaterial
  in Optics letters
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Di Caprio G, Dardano P, Coppola G, Cabrini S, Mocella V (literal)

Pagina inizio

• 1142 (literal)

Pagina fine

• 1144 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

• http://www.opticsinfobase.org/ol/issue.cfm?volume=37&issue=7 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 37 (literal)

Rivista

• Optics letters (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 3 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

• 7 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• [ 1 ] Natl Council Res CNR Unita Napoli, IMM, I-80131 Naples, Italy [ 2 ] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA (literal)

Titolo

• Digital holographic microscopy characterization of superdirective beam by metamaterial (literal)

Abstract

• Digital holographic microscopy (DHM) has been successfully applied for the first time to characterize the radiative out-of-plane emission properties of a superdirective device. Complementarily to near-field microscopy, DHM allows us to reconstruct the beam in the far-field region. The angular dispersion of the light beam radiated from a grating composed of air and anti-air metamaterial has been determined, and the proposed technique has highlighted a collimation degree higher than 0.04 degrees, as already evaluated in a previous work. Further considerations on the retrieved phase map of the beam in the acquisition plane are presented. (literal)

Prodotto di

• Microsistemi optoelettronici in silicio e tecnologie compatibili (MD.P05.014.001) (Modulo)
• Institute for microelectronics and microsystems (IMM) (Istituto)

Autore CNR

• VITO MOCELLA (Persona)
• PRINCIPIA DARDANO (Persona)
• GIUSEPPE COPPOLA (Persona)

Insieme di parole chiave

• Keywords of "Digital holographic microscopy characterization of superdirective beam by metamaterial" (Insieme di parole chiave)

Incoming links:

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Microsistemi optoelettronici in silicio e tecnologie compatibili (MD.P05.014.001) (Modulo)

Autore CNR di

• VITO MOCELLA (Persona)
• PRINCIPIA DARDANO (Persona)
• GIUSEPPE COPPOLA (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Optics letters (Rivista)

Insieme di parole chiave di

• Keywords of "Digital holographic microscopy characterization of superdirective beam by metamaterial" (Insieme di parole chiave)