http://www.cnr.it/ontology/cnr/individuo/prodotto/ID206733
The issue of pseudoreplication when applying a statistical exploratory approach to extract relevant features from ToF-SIMS spectra (Articolo in rivista)
- Type
- Label
- The issue of pseudoreplication when applying a statistical exploratory approach to extract relevant features from ToF-SIMS spectra (Articolo in rivista) (literal)
- Anno
- 2013-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1002/sia.5251 (literal)
- Alternative label
Rossana Dell'Anna 1, Roberto Canteri 1, Nicola Coppedè 2, Salvatore Iannotta 2, Massimo Bersani 1 (2013)
The issue of pseudoreplication when applying a statistical exploratory approach to extract relevant features from ToF-SIMS spectra
in Surface and interface analysis (Online); Wiley, New York (Stati Uniti d'America)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Rossana Dell'Anna 1, Roberto Canteri 1, Nicola Coppedè 2, Salvatore Iannotta 2, Massimo Bersani 1 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://onlinelibrary.wiley.com/doi/10.1002/sia.5251/abstract;jsessionid=20E0B4B541586C704776B1351992663A.d04t01 (literal)
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1 Fondazione Bruno Kessler - Center for Materials and Microsystems, Via Sommarive 18, 38123 Povo (Trento), Italy; 2 IMEM-CNR Istituto dei Materiali per l' Elettronica ed il Magnetismo, Parco Area delle Scienze 37/A, 43124 Parma, Italy (literal)
- Titolo
- The issue of pseudoreplication when applying a statistical exploratory approach to extract relevant features from ToF-SIMS spectra (literal)
- Abstract
- The issue of automated peak selection in time-of-flight secondary ion mass spectrometry (ToF-SIMS) spectra is examined in relation to the hierarchical nature of the experimental design and the related existence of observations which are not statistically independent. To avoid unreliable results, the presence of pseudoreplication should be taken into account correctly. A combination
of the recommended univariate peak selection approach with some multivariate techniques, namely principal component analysis
and heat map data representation, is proposed to highlight and analyze obtained results for a set of ToF-SIMS spectra from copper
phthalocyanine thin films grown on TiO2 substrates by a supersonic beam deposition apparatus. New insight is obtained on the
effectiveness of the deposition for different working parameters of the process. (literal)
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