Effect of temperature on the mutual diffusion of Ge/GaAs and GaAs/Ge (Articolo in rivista)

Type
Label
  • Effect of temperature on the mutual diffusion of Ge/GaAs and GaAs/Ge (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.jcrysgro.2010.10.101 (literal)
Alternative label
  • Bosi, Matteo 1, Attolini, Giovanni 1, Ferrari, Claudio 1, Frigeri, Cesare 1, Calicchio, Marco 1, Rossi, Francesca 1, Kalman Vad 2, Attila Csik 2, Zsolt Zolnai 3 (2011)
    Effect of temperature on the mutual diffusion of Ge/GaAs and GaAs/Ge
    in Journal of crystal growth; ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Bosi, Matteo 1, Attolini, Giovanni 1, Ferrari, Claudio 1, Frigeri, Cesare 1, Calicchio, Marco 1, Rossi, Francesca 1, Kalman Vad 2, Attila Csik 2, Zsolt Zolnai 3 (literal)
Pagina inizio
  • 367 (literal)
Pagina fine
  • 371 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • The 16th International Conference on Crystal Growth (ICCG16)/The 14th International Conference on Vapor Growth and Epitaxy (ICVGE14) ID_PUMA: cnr.imem/2011-A0-063 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.sciencedirect.com/science/article/pii/S002202481000847X (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 318 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 5 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 1 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • [ 1 ] IMEM CNR Inst, I-43124 Parma, Italy; [ 2 ] Hungarian Acad Sci, Inst Nucl Res, H-4001 Debrecen, Hungary; [ 3 ] Hungarian Acad Sci, Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary (literal)
Titolo
  • Effect of temperature on the mutual diffusion of Ge/GaAs and GaAs/Ge (literal)
Abstract
  • We studied the diffusion of Ge, As and Ga in GaAs/Ge and Ge/GaAs epilayers grown at different temperatures by metal-organic vapor phase epitaxy using iso-butylgermane, arsine and trimethylgallium in hydrogen atmosphere at low pressure. The use of low temperature buffer layers was investigated in order to overcome the diffusion problem. High-resolution X-ray diffraction and transmission electron microscopy were used to assess the crystal quality, while secondary neutral mass spectrometry has been employed to investigate diffusion profiles in the samples. As it is well known, the diffusivity of the atoms (e.g. Ga, As, Ge) and intermixing of layers during sample preparation strongly depend on the substrate temperature. We found that the use of a low temperature GaAs buffer layer reduced the diffusion in GaAs/Ge epitaxy at 600 °C; while a Ge low temperature buffer layer was not effective in reducing the interdiffusion in Ge/GaAs epitaxy at 700 °C. (literal)
Editore
Prodotto di
Autore CNR
Insieme di parole chiave

Incoming links:


Prodotto
Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Editore di
Insieme di parole chiave di
data.CNR.it