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					Homoepitaxial growth of germanium for photovoltaic and thermophotovoltaic applications (Articolo in rivista)
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- Label
- Homoepitaxial growth of germanium for photovoltaic and thermophotovoltaic applications (Articolo in rivista) (literal)
 
- Anno
- 2011-01-01T00:00:00+01:00 (literal)
 
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.jcrysgro.2010.10.112 (literal)
 
- Alternative label
- Bosi, Matteo, Attolini, Giovanni,  Calicchio, Marco, Ferrari, Claudio,  Frigeri, Cesare,  Gombia, Enos,  Motta, Alberto, Rossi, Francesca (2011)
 Homoepitaxial growth of germanium for photovoltaic and thermophotovoltaic applications
 in Journal of crystal growth; ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
 (literal)
 
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Bosi, Matteo, Attolini, Giovanni,  Calicchio, Marco, Ferrari, Claudio,  Frigeri, Cesare,  Gombia, Enos,  Motta, Alberto, Rossi, Francesca (literal)
 
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- The 16th International Conference on Crystal Growth (ICG16)/The 14th International Conference on Vapor Growth and Epitaxy (ICVGE14) - 8-13 August, 2010, Beijn, China
ID_PUMA: cnr.imem/2011-A0-057 (literal)
 
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- http://www.sciencedirect.com/science/article/pii/S0022024810008602# (literal)
 
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- ISI Web of Science (WOS) (literal)
 
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- IMEM CNR Inst, I-43124 Parma, Italy (literal)
 
- Titolo
- Homoepitaxial growth of germanium for photovoltaic and thermophotovoltaic applications (literal)
 
- Abstract
- In the present work homoepitaxial Ge layers were deposited by means of metal organic vapor phase epitaxy (MOVPE) on Ge using iso-butyl germane (iBuGe) as ametal organic precursor. Layers of different thicknesses were grown by varying the deposition temperature between 550 and 700 1C on n- and p-type Ge substrates. The films were found to be intrinsically p-type with high carrier concentration, but using AsH3 it was possible to achieve n-type doping. TEM and X-ray diffraction were used to assess the good crystallographic quality of the layers. By depositing a p-type layer onto an n-type Ge substrate or, vice versa, an n-type layer on a p-type Ge substrate is was possible to realize p/n (or n/p) junctions. Mesa structures were realized in order to perform electrical characterizations of the junctions. (literal)
 
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