Growth and characterization of CZT crystals by the vertical Bridgman method for X-Ray detector applications (Articolo in rivista)

Type
Label
  • Growth and characterization of CZT crystals by the vertical Bridgman method for X-Ray detector applications (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1109/TNS.2011.2163643 (literal)
Alternative label
  • Zappettini, Andrea 1, Marchini, Laura 1, Zha, Mingzheng 1, Benassi, Giacomo 1, Zambelli, Nicola 1, Calestani, Davide 1, Zanotti, Lucio 1, Gombia, Enos 1, Mosca, Roberto 1, Zanichelli, Massimiliano 2, Pavesi, Maura 2, Auricchio, Natalia 3, Caroli, Ezio 3 (2011)
    Growth and characterization of CZT crystals by the vertical Bridgman method for X-Ray detector applications
    in IEEE transactions on nuclear science; IEEE-Institute Of Electrical And Electronics Engineers Inc., Piscataway (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Zappettini, Andrea 1, Marchini, Laura 1, Zha, Mingzheng 1, Benassi, Giacomo 1, Zambelli, Nicola 1, Calestani, Davide 1, Zanotti, Lucio 1, Gombia, Enos 1, Mosca, Roberto 1, Zanichelli, Massimiliano 2, Pavesi, Maura 2, Auricchio, Natalia 3, Caroli, Ezio 3 (literal)
Pagina inizio
  • 2352 (literal)
Pagina fine
  • 2356 (literal)
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  • ID_PUMA: cnr.imem/2011-A0-048 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6025230 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 58 (literal)
Rivista
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  • 5 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 5 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • [ 1 ] IMEM CNR, I-43100 Parma, Italy; [ 2 ] Univ Parma, Dept Phys, I-43100 Parma, Italy; [ 3 ] INAF IASF Bo, I-40129 Bologna, Italy (literal)
Titolo
  • Growth and characterization of CZT crystals by the vertical Bridgman method for X-Ray detector applications (literal)
Abstract
  • CdZnTe crystals were grown by the vertical Bridgman method in closed quartz ampoules. The crystalline quality and the impurity content of these crystals were studied. Several X-ray detectors were cut out of these crystals. The resistivity, emission spectra, ?? product, and spectroscopic characteristics of these detectors were extensively measured and compared with the characteristics of detectors obtained from CdZnTe crystals grown by the boron oxide encapsulated vertical Bridgman technique. The detectors prepared from crystals grown without boron oxide show good ?? value, spectroscopic resolution, and higher reproducibility. The influence of growth method on impurity content and on detector response was discussed. (literal)
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