Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector (Articolo in rivista)

Type
Label
  • Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1364/OL.32.002593 (literal)
Alternative label
  • Calegari F; Valentini G; Vozzi C; Benedetti E; Cabanillas-Gonzalez J; Faenov A; Gasilov S; Pikuz T; Poletto L; Sansone G; Villoresi P; Nisoli M; De Silvestri S; Stagira S (2007)
    Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector
    in Optics letters
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Calegari F; Valentini G; Vozzi C; Benedetti E; Cabanillas-Gonzalez J; Faenov A; Gasilov S; Pikuz T; Poletto L; Sansone G; Villoresi P; Nisoli M; De Silvestri S; Stagira S (literal)
Pagina inizio
  • 2593 (literal)
Pagina fine
  • 2595 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.opticsinfobase.org/ol/abstract.cfm?uri=ol-32-17-2593 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 32 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1-5,7,10,12-14 : National Laboratory for Ultrafast and Ultraintense Optical Science, CNR-INFM, Politecnico, Milan, Italy / 6,8 : Kansai Photon Science Institute, Japan Atomic Energy Agency (JAEA), Kizu-cho, Kyoto, Japan / 6,8 : Joint Institute for High Temperature, RAS, Moscow, Russian Federation / 9,11 : Laboratory for Ultraviolet and X-Ray Optical Research - CNR-INFM, DEI, Padua University, Padua, Italy (literal)
Titolo
  • Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector (literal)
Abstract
  • Elemental sensitivity in soft x-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft x-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers. (c) 2007 Optical Society of America. (literal)
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