http://www.cnr.it/ontology/cnr/individuo/prodotto/ID2030
Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector (Articolo in rivista)
- Type
- Label
- Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector (Articolo in rivista) (literal)
- Anno
- 2007-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1364/OL.32.002593 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Calegari F; Valentini G; Vozzi C; Benedetti E; Cabanillas-Gonzalez J; Faenov A; Gasilov S; Pikuz T; Poletto L; Sansone G; Villoresi P; Nisoli M; De Silvestri S; Stagira S (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.opticsinfobase.org/ol/abstract.cfm?uri=ol-32-17-2593 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Note
- ISI Web of Science (WOS) (literal)
- Scopu (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1-5,7,10,12-14 : National Laboratory for Ultrafast and Ultraintense Optical Science, CNR-INFM, Politecnico, Milan, Italy /
6,8 : Kansai Photon Science Institute, Japan Atomic Energy Agency (JAEA), Kizu-cho, Kyoto, Japan /
6,8 : Joint Institute for High Temperature, RAS, Moscow, Russian Federation /
9,11 : Laboratory for Ultraviolet and X-Ray Optical Research - CNR-INFM, DEI, Padua University, Padua, Italy (literal)
- Titolo
- Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector (literal)
- Abstract
- Elemental sensitivity in soft x-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft x-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers. (c) 2007 Optical Society of America. (literal)
- Prodotto di
- Autore CNR
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- Prodotto
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi