Evaluation of Emulsion Film Thickness at the Nanoscale Level by the Optical Evanescent Wave Effect (Abstract/Poster in atti di convegno)

Type
Label
  • Evaluation of Emulsion Film Thickness at the Nanoscale Level by the Optical Evanescent Wave Effect (Abstract/Poster in atti di convegno) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Alternative label
  • Gabrieli Riccardo, Loglio Giuseppe, Pandolfini Piero, Fabbri Anna, Simoncini Madine, Kovalchuk Volodymyr, Noskov Boris, Makievski Alexander, Krägel Jürgen, Miller Reinhard , Ravera Francesca, Liggieri Libero (2012)
    Evaluation of Emulsion Film Thickness at the Nanoscale Level by the Optical Evanescent Wave Effect
    in 5th International Workshop Bubble and Drop Interfaces, Krakov, Poland
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Gabrieli Riccardo, Loglio Giuseppe, Pandolfini Piero, Fabbri Anna, Simoncini Madine, Kovalchuk Volodymyr, Noskov Boris, Makievski Alexander, Krägel Jürgen, Miller Reinhard , Ravera Francesca, Liggieri Libero (literal)
Note
  • Poster (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • SELEX Galileo, Campi Bisenzio, Florence, Italy, Universita degli Studi di Firenze, Sesto Fiorentino, Florence, Italy, Institute of Biocolloid Chemistry, Kiev, Ukraine, St.Petersburg State University, Department of Colloid Chemistry, St. Petersburg, Russia, SINTERFACE Technologies, Berlin, Germany MPI für Kolloid - und Grenzflächenforschung, Potsdam-Golm, Germany CNR - Istituto per l'Energetica e le Interfasi, Genova, Italy (literal)
Titolo
  • Evaluation of Emulsion Film Thickness at the Nanoscale Level by the Optical Evanescent Wave Effect (literal)
Abstract
  • The advancement of the knowledge about the rheology and hydrodynamics of thin films assists in a specific manner the industrial applications concerning emulsions and foams. Actually, the stability of these complex systems is largely influenced by the dynamics of the thin interfacial film intervening between approaching or separating droplets or bubbles. During the recent years, the project LIFT (Liquid Film Tensiometer) was supported by the national Italian Space Agency (ASI) with the aim of pursuing fundamental achievements in the field of thin emulsion films. In a future LIFT microgravity mission the film thickness, as the most important film parameter, will be measured at the nanoscale level by two simultaneous complementary methods, namely by the well-established interferometric technique and by a new application of the optical evanescent wave technique. The scope of the poster is the illustration of the above-mentioned new methodology for the evaluation of the film thickness by the evanescent wave technique. Example results are reported for the liquid/liquid system \" n-decane/SDS aqueous solution / n-decane \". (literal)
Prodotto di
Autore CNR

Incoming links:


Autore CNR di
Prodotto
data.CNR.it