Microstructure and transport properties in alloyed Ohmic contacts to p-type SiC and GaN for power devices applications (Articolo in rivista)

Type
Label
  • Microstructure and transport properties in alloyed Ohmic contacts to p-type SiC and GaN for power devices applications (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.4028/www.scientific.net/MSF.711.203 (literal)
Alternative label
  • F. Roccaforte 1, A. Frazzetto 1, G. Greco 1, R. Lo Nigro 1, F. Giannazzo 1, M. Leszczynski 2, P. Pristawko 2, E. Zanetti 3, M. Saggio 3, V. Raineri 1 (2012)
    Microstructure and transport properties in alloyed Ohmic contacts to p-type SiC and GaN for power devices applications
    in Materials science forum
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • F. Roccaforte 1, A. Frazzetto 1, G. Greco 1, R. Lo Nigro 1, F. Giannazzo 1, M. Leszczynski 2, P. Pristawko 2, E. Zanetti 3, M. Saggio 3, V. Raineri 1 (literal)
Pagina inizio
  • 203 (literal)
Pagina fine
  • 207 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 711 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1 CNR-IMM, Catania, Italy 2 Institute of High Pressure Physics, Warsaw, Poland 3 STMIcroelectronics, Catania, Italy (literal)
Titolo
  • Microstructure and transport properties in alloyed Ohmic contacts to p-type SiC and GaN for power devices applications (literal)
Prodotto di
Autore CNR

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