http://www.cnr.it/ontology/cnr/individuo/prodotto/ID197707
Electrical and optical investigations on Pb1-3x/2LaxZr0.2Ti0.8O3 thin films obtained by radiofrequency assisted pulsed laser deposition (Articolo in rivista)
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- Electrical and optical investigations on Pb1-3x/2LaxZr0.2Ti0.8O3 thin films obtained by radiofrequency assisted pulsed laser deposition (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.tsf.2011.11.066 (literal)
- Alternative label
Scarisoreanu, N.D. (a); Andrei. A. (b); Birjega. R. (b); Pascu, R. (b); Craciun, F. (c); Galassi, C. (d); Raducanu, D. (e); Dinescu, M. (b) (2012)
Electrical and optical investigations on Pb1-3x/2LaxZr0.2Ti0.8O3 thin films obtained by radiofrequency assisted pulsed laser deposition
in Thin solid films (Print); Elsevier, Amsterdam (Paesi Bassi)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Scarisoreanu, N.D. (a); Andrei. A. (b); Birjega. R. (b); Pascu, R. (b); Craciun, F. (c); Galassi, C. (d); Raducanu, D. (e); Dinescu, M. (b) (literal)
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- http://www.sciencedirect.com/science/article/pii/S0040609011020803 (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- a) National Institute for Research and Development in Microtehnologies, Iancu Nicolae 126A, 077190 Bucharest, Romania
b) National Institute for Laser, Plasma and Radiation Physics, PO Box MG-16 Magurele, 077125 Bucharest, Romania
c) CNR-ISC, Istituto dei Sistemi Complessi, Area della Ricerca Roma-Tor Vergata, Via del Fosso del Cavaliere 100, I-0013, Rome, Italy
d) CNR-ISTEC, Via Granarolo 64, I-48018 Faenza, Italy
e) POLITEHNICA University of Bucharest, Spl. Independentei 313, 060042, Bucharest, Romania (literal)
- Titolo
- Electrical and optical investigations on Pb1-3x/2LaxZr0.2Ti0.8O3 thin films obtained by radiofrequency assisted pulsed laser deposition (literal)
- Abstract
- Thin films of ferroelectric relaxor Pb1 - 3x/2LaxZr0.2Ti0.8O3, x = 0.22 have been integrated in an oxidic heterostructure for electro-optical investigations. The quadratic electro-optic behavior and optical properties have been studied by means of variable angle spectroscopic ellipsometry method in reflection mode. Birefringence values up to ?? = 0.17° have been obtained for quadratic compositions at ? = 540 nm and 65° angle of incidence. Structural, chemical and morphologic properties of Pb1-3x/2LaxZr0.2Ti0.8O3 (x = 0.22) thin films have been investigated by x-ray diffraction and atomic force microscopy techniques. The dielectric and ferroelectric behavior has been investigated using dielectric spectroscopy and a ferroelectric test system. (literal)
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