Time-resolved morphological study of 'PEDOT:PSS' hole transporting layer for polymer solar cells (Articolo in rivista)

Type
Label
  • Time-resolved morphological study of 'PEDOT:PSS' hole transporting layer for polymer solar cells (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.synthmet.2012.02.028 (literal)
Alternative label
  • D. Bailo, A. Generosi, V. Rossi Albertini, R. Caminiti, R. De Bettignies, B. Paci (2012)
    Time-resolved morphological study of 'PEDOT:PSS' hole transporting layer for polymer solar cells
    in Synthetic metals; ELSEVIER SCIENCE SA, PO BOX 564, 1001 LAUSANNE (Svizzera)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • D. Bailo, A. Generosi, V. Rossi Albertini, R. Caminiti, R. De Bettignies, B. Paci (literal)
Pagina inizio
  • 808 (literal)
Pagina fine
  • 812 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 162 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 9-10 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • ISM-CNR-Area di Ricerca di Tor Vergata, Via del Fosso del Cavaliere 100, 00133 Roma, Italy Dip.to di Chimica, Università \"La Sapienza\", P.le A. Moro 5, 00185 Roma, Italy Laboratoire Composants Solaires CEA INES-RDI, Savoie Technolac, BP 332, 50 avenue du lac Léman, 73377 Le Bourget du Lac, France (literal)
Titolo
  • Time-resolved morphological study of 'PEDOT:PSS' hole transporting layer for polymer solar cells (literal)
Abstract
  • The reliability of the polymeric hole transport layer poly(3,4-ethylenedioxythiophene):poly(styrene-sulphonate) (PEDOT:PSS), used in organic photovoltaic and single carrier diodes was addressed. The morphological properties of the blend were monitored during thermal treatments and under controlled humidity condition. The approach adopted, relying on joint use of in situ energy dispersive X-ray reflectivity (EDXR) and atomic force microscopy (AFM) techniques, allowed to observe, in real time, the occurrence of degradation phenomena related to both bulk and interface effects. Additionally, Fourier transform infrared (FTIR) spectroscopy experiments provided information on the chemical properties correlated to the blend morphological modifications. The overall approach allowed to identify aging process that may compromise the chemical-physical characteristics of the PEDOT:PSS hole conducting layer and, in turn, may have a relevant impact on the performances of the organic devices. (literal)
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