http://www.cnr.it/ontology/cnr/individuo/prodotto/ID194164
Size dependent carrier thermal escape and transfer in bimodally distributed self assembled InAs/GaAs quantum dots (Articolo in rivista)
- Type
- Label
- Size dependent carrier thermal escape and transfer in bimodally distributed self assembled InAs/GaAs quantum dots (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1063/1.4729315 (literal)
- Alternative label
G Munoz-Matutano, I Suarez, J Canet-Ferrer, B Alen, D Rivas, L Seravalli, Giovanna Trevisi, P Frigeri, and J Martinez-Pastor (2012)
Size dependent carrier thermal escape and transfer in bimodally distributed self assembled InAs/GaAs quantum dots
in Journal of applied physics (online); American Institute Of Physics (AIP), Melville (Stati Uniti d'America)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- G Munoz-Matutano, I Suarez, J Canet-Ferrer, B Alen, D Rivas, L Seravalli, Giovanna Trevisi, P Frigeri, and J Martinez-Pastor (literal)
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- 1 ICMUV, Instituto de Ciencia de Materiales, Universidad de Valencia, P.O. Box 2085, 46071 Valencia, Spain
2 IMM, Instituto de Microelectro ?nica de Madrid (CNM, CSIC), Isaac Newton 8, 28760 Tres Cantos,
Madrid, Spain
3 Istituto dei Materiali per lElettronica e il Magnetismo (CNR), Parco delle Scienze 37/a, I-43100 Parma, Italy (literal)
- Titolo
- Size dependent carrier thermal escape and transfer in bimodally distributed self assembled InAs/GaAs quantum dots (literal)
- Abstract
- We have investigated the temperature dependent recombination dynamics in two bimodally distributed InAs self assembled quantum dots samples. A rate equations model has been implemented to investigate the thermally activated carrier escape mechanism which changes from exciton-like to uncorrelated electron and hole pairs as the quantum dot size varies. For the smaller dots, we find a hot exciton thermal escape process. We evaluated the thermal transfer process between quantum dots by the quantum dot density and carrier escape properties of both samples. (literal)
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