Size dependent carrier thermal escape and transfer in bimodally distributed self assembled InAs/GaAs quantum dots (Articolo in rivista)

Type
Label
  • Size dependent carrier thermal escape and transfer in bimodally distributed self assembled InAs/GaAs quantum dots (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.4729315 (literal)
Alternative label
  • G Munoz-Matutano, I Suarez, J Canet-Ferrer, B Alen, D Rivas, L Seravalli, Giovanna Trevisi, P Frigeri, and J Martinez-Pastor (2012)
    Size dependent carrier thermal escape and transfer in bimodally distributed self assembled InAs/GaAs quantum dots
    in Journal of applied physics (online); American Institute Of Physics (AIP), Melville (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • G Munoz-Matutano, I Suarez, J Canet-Ferrer, B Alen, D Rivas, L Seravalli, Giovanna Trevisi, P Frigeri, and J Martinez-Pastor (literal)
Pagina inizio
  • 123522-1 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 111 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 8 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 12 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1 ICMUV, Instituto de Ciencia de Materiales, Universidad de Valencia, P.O. Box 2085, 46071 Valencia, Spain 2 IMM, Instituto de Microelectro ?nica de Madrid (CNM, CSIC), Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain 3 Istituto dei Materiali per lElettronica e il Magnetismo (CNR), Parco delle Scienze 37/a, I-43100 Parma, Italy (literal)
Titolo
  • Size dependent carrier thermal escape and transfer in bimodally distributed self assembled InAs/GaAs quantum dots (literal)
Abstract
  • We have investigated the temperature dependent recombination dynamics in two bimodally distributed InAs self assembled quantum dots samples. A rate equations model has been implemented to investigate the thermally activated carrier escape mechanism which changes from exciton-like to uncorrelated electron and hole pairs as the quantum dot size varies. For the smaller dots, we find a hot exciton thermal escape process. We evaluated the thermal transfer process between quantum dots by the quantum dot density and carrier escape properties of both samples. (literal)
Editore
Prodotto di
Autore CNR
Insieme di parole chiave

Incoming links:


Autore CNR di
Prodotto
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Editore di
Insieme di parole chiave di
data.CNR.it