The interface between Gd2O3 films and Ge(001): A comparative study between molecular and atomic oxygen mediated growths (Articolo in rivista)

Type
Label
  • The interface between Gd2O3 films and Ge(001): A comparative study between molecular and atomic oxygen mediated growths (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • Molle, A; Perego, M; Bhuiyan, MNK; Wiemer, C; Tallarida, G; Fanciulli, M (2007)
    The interface between Gd2O3 films and Ge(001): A comparative study between molecular and atomic oxygen mediated growths
    in Journal of applied physics
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Molle, A; Perego, M; Bhuiyan, MNK; Wiemer, C; Tallarida, G; Fanciulli, M (literal)
Pagina inizio
  • 034513 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 102 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • INFM, CNR, Lab Nazl MDM, I-20041 Agrate Brianza, Italy (literal)
Titolo
  • The interface between Gd2O3 films and Ge(001): A comparative study between molecular and atomic oxygen mediated growths (literal)
Abstract
  • The interface properties of thin Gd2O3 films grown on Ge(001) are studied as a function of the oxidizing species used during the deposition. The mediation of molecular oxygen during growth produces a crystalline oxide with an atomically sharp and contamination-free interface on the Ge substrate. Conversely, an interface layer of substoichiometric germanium oxide occurs whenever atomic oxygen radicals are used. The two different Gd2O3/Ge interfacial configurations are discussed basing on thermodynamic arguments. (c) 2007 American Institute of Physics. (literal)
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