Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis (Articolo in rivista)

Type
Label
  • Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.ultramic.2011.03.016 (literal)
Alternative label
  • Felisari, L. 2,3, Grillo, V. 1,4, Jabeen, F. 2, Rubini, S. 2, Menozzi, C. 1,5, Rossi, F. 4, Martelli, F. 2,6 (2011)
    Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis
    in Ultramicroscopy (Amst.); ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Felisari, L. 2,3, Grillo, V. 1,4, Jabeen, F. 2, Rubini, S. 2, Menozzi, C. 1,5, Rossi, F. 4, Martelli, F. 2,6 (literal)
Pagina inizio
  • 1018 (literal)
Pagina fine
  • 1028 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • ID_PUMA: cnr.imem/2011-A0-027 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 11 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 8 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. Ist Nanosci S3 CNR, I-41125 Modena, Italy; 2. INFM CNR, TASC, I-34149 Trieste, Italy; 3. Consorzio Fis, I-34149 Trieste, Italy; 4. IMEM CNR, I-43124 Parma, Italy; 5. Univ Modena & Reggio Emilia, Dipartimento Fis, I-41100 Modena, Italy; 6. IMM CNR, I-00133 Rome, Italy (literal)
Titolo
  • Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis (literal)
Abstract
  • A dedicated specimen holder has been designed to perform low-voltage scanning transmission electron microscopy in dark field mode. Different test samples, namely InGaAs/GaAs quantum wells, InGaAs nanowires and thick InGaAs layers, have been analysed to test the reliability of the model based on the proportionality to the specimen mass-thickness, generally used for image intensity interpretation of scattering contrast processes. We found that size of the probe, absorption and channelling must be taken into account to give a quantitative interpretation of image intensity. We develop a simple procedure to evaluate the probe-size effect and to obtain a quantitative indication of the absorption coefficient. Possible artefacts induced by channelling are pointed out. With the developed procedure, the low voltage approach can be successfully applied for quantitative compositional analysis. The method is then applied to the estimation of the In content in the core of InGaAs/GaAs core-shell nanowires. (literal)
Editore
Prodotto di
Autore CNR
Insieme di parole chiave

Incoming links:


Autore CNR di
Prodotto
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Editore di
Insieme di parole chiave di
data.CNR.it