Long-term reliability and performance of lwIP on FreeRTOS and NXP LPC 24xx/17xx (Rapporti tecnici, manuali, carte geologiche e tematiche e prodotti multimediali)

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  • Long-term reliability and performance of lwIP on FreeRTOS and NXP LPC 24xx/17xx (Rapporti tecnici, manuali, carte geologiche e tematiche e prodotti multimediali) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Alternative label
  • Tingting Hu, Ivan Cibrario Bertolotti (2012)
    Long-term reliability and performance of lwIP on FreeRTOS and NXP LPC 24xx/17xx
    (literal)
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  • Tingting Hu, Ivan Cibrario Bertolotti (literal)
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  • 1 (literal)
Pagina fine
  • 9 (literal)
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  • CNR - National Research Council of Italy, IEIIT (literal)
Titolo
  • Long-term reliability and performance of lwIP on FreeRTOS and NXP LPC 24xx/17xx (literal)
Abstract
  • This document describes in detail the test harness and procedure followed to evaluate the long-term reliability and performance of the lwIP protocol stack on the FreeRTOS operating system and an NXP LPC 24xx/17xx microcontroller, in view of its adoption as a reusable module within ongoing Velex firmware development projects. In particular, it discusses which tests have been performed, their results, and any corrective action undertaken as a consequence. (literal)
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