How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope (Articolo in rivista) (literal)

Anno

• 2012-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1088/0957-0233/23/5/055402 (literal)

Alternative label

• Carlo Dri, Friedrich Esch, Cristina Africh and Giovanni Comelli (2012)
  How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope
  in Measurement science & technology (Print)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Carlo Dri, Friedrich Esch, Cristina Africh and Giovanni Comelli (literal)

Pagina inizio

• 055402 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

• http://iopscience.iop.org/0957-0233/23/5/055402 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 23 (literal)

Rivista

• Measurement science & technology (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 9 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

• 5 (literal)

Note

• ISI Web of Science (WOS) (literal)
• Scopu (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• 1. IOM-CNR Laboratorio TASC, Area Science Park, SS 14 Km 163.5, I-34149 Basovizza (TS), Italy; 2. Department Chemie, Technische Universität München, Lichtenbergstr 4, D-85748 Garching, Germany; 3. Department of Physics, CENMAT, University of Trieste, Via A Valerio 2, 34127 Trieste, Italy (literal)

Titolo

• How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope (literal)

Abstract

• The implementation of fast measurement modes in conventional scanning tunneling microscopes (STM) generally implies that at least the fast scanning frequency reaches or exceeds the first resonance frequency of the scanning stage. We present a straightforward protocol for the determination of accessible frequency windows, where high spatial resolution can be routinely achieved and maintained during the fast scanning movement. This protocol relies on a simple, in situ method to locate these frequency windows by measuring the response in the characteristic probe signal while varying the tip-sample distance. The method is compared to other approaches used to characterize the resonant behavior of STMs. In principle, the protocol can also be applied to other types of scanning probe microscopes with sufficiently fast probe signal detection, as a general approach to upgrade these instruments to faster imaging rates. (literal)

Prodotto di

• MD.P06.016.001 Proprieta' elettroniche e strutturali di sistemi a bassa dimensionalita' (MD.P06.016.003) (Modulo)

Autore CNR

• FRIEDRICH ESCH (Unità di personale esterno)
• CRISTINA AFRICH (Unità di personale interno)
• GIOVANNI COMELLI (Persona)
• CARLO DRI (Persona)

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• Parole chiave di "How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope" (Insieme di parole chiave)

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Autore CNR di

• CARLO DRI (Persona)
• GIOVANNI COMELLI (Persona)
• CRISTINA AFRICH (Unità di personale interno)
• FRIEDRICH ESCH (Unità di personale esterno)

Prodotto

• MD.P06.016.001 Proprieta' elettroniche e strutturali di sistemi a bassa dimensionalita' (MD.P06.016.003) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Measurement science & technology (Rivista)

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• Parole chiave di "How to select fast scanning frequencies for high-resolution fast STM measurements with a conventional microscope" (Insieme di parole chiave)