The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study (Articolo in rivista) (literal)

Anno

• 2010-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1063/1.3509777 (literal)

Alternative label

• Rong Rong Zhan, Erik Vesselli, Alessandro Baraldi, Silvano Lizzit, Giovanni Comelli (2010)
  The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study
  in THE JOURNAL OF CHEMICAL PHYSICS; American Institute of Physics, Melville [NY] (Stati Uniti d'America)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Rong Rong Zhan, Erik Vesselli, Alessandro Baraldi, Silvano Lizzit, Giovanni Comelli (literal)

Pagina inizio

• 214701 (literal)

Pagina fine

• 214707 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

• http://jcp.aip.org/resource/1/jcpsa6/v133/i21/p214701_s1 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 133 (literal)

Rivista

• THE JOURNAL OF CHEMICAL PHYSICS (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 7 (literal)

Note

• ISI Web of Science (WOS) (literal)
• Scopus (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• Physics Department and Center of Excellence for Nanostructured Materials, University of Trieste, via A. Valerio 2, 34127--Trieste, Italy IOM CNR, Laboratorio TASC, AREA Science Park, SS 14 km 163.5, 34149 Trieste, Italy Sincrotrone Trieste SCpA, AREA Science Park, SS 14 km 163.5, 34149 Trieste, Italy (literal)

Titolo

• The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study (literal)

Abstract

• The surface and interface structure of the RhO2 ultrathin film grown on Rh(100) is investigated by means of x-ray photoelectron diffraction. Experimental and simulated one- and two-dimensional angular distribution intensities of the O1s and Rh3d5/2 chemically shifted core levels are quantitatively analyzed. The previously proposed O-Rh-O trilayer model is independently confirmed. A rippled buckling of the metal surface is observed at the oxide-metal interface, with a mean interfacial Rh-O distance which is 0.2 Å larger with respect to previous findings. The link between the local atomic rearrangement and the overall geometric and electronic properties of the oxide is discussed on the basis of a thorough comparison with the corresponding RhO2 rutile structure. (literal)

Editore

• American Institute of Physics (Editore)

Prodotto di

• MD.P06.016.001 Proprieta' elettroniche e strutturali di sistemi a bassa dimensionalita' (MD.P06.016.003) (Modulo)

Autore CNR

• ERIK VESSELLI (Persona)
• GIOVANNI COMELLI (Persona)
• ALESSANDRO BARALDI (Unità di personale esterno)

Insieme di parole chiave

• Parole chiave di "The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ALESSANDRO BARALDI (Unità di personale esterno)
• GIOVANNI COMELLI (Persona)
• ERIK VESSELLI (Persona)

Prodotto

• MD.P06.016.001 Proprieta' elettroniche e strutturali di sistemi a bassa dimensionalita' (MD.P06.016.003) (Modulo)

Editore di

• American Institute of Physics (Editore)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• THE JOURNAL OF CHEMICAL PHYSICS (Rivista)

Insieme di parole chiave di

• Parole chiave di "The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study" (Insieme di parole chiave)