http://www.cnr.it/ontology/cnr/individuo/prodotto/ID191428
Introduction of Zr in nanometric periodic Mg/Co multilayers (Articolo in rivista)
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- Label
- Introduction of Zr in nanometric periodic Mg/Co multilayers (Articolo in rivista) (literal)
- Anno
- 2011-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1007/s00339-010-6093-2 (literal)
- Alternative label
Le Guen, Karine (1); Hu, Minhui (1); André, Jean Michel (1); Jonnard, Philippe (1);
Zhou, S.K. (2); Li, H.C. (2); Zhu, J.T. (2); Wang Z.S. (2)
Mahne, Nicola (3), Giglia, Angelo (3), Nannarone, Stefano (3) (2011)
Introduction of Zr in nanometric periodic Mg/Co multilayers
in Applied physics. A, Materials science & processing (Print); Springer, Berlin (Germania)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Le Guen, Karine (1); Hu, Minhui (1); André, Jean Michel (1); Jonnard, Philippe (1);
Zhou, S.K. (2); Li, H.C. (2); Zhu, J.T. (2); Wang Z.S. (2)
Mahne, Nicola (3), Giglia, Angelo (3), Nannarone, Stefano (3) (literal)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://link.springer.com/article/10.1007%2Fs00339-010-6093-2 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- (1) Laboratoire de Chimie Physique--Matière Rayonnement, UPMC Univ Paris 06, CNRS UMR 7614, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France
(2) Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, P.R. China
(3) Istituto Officina dei Materiali IOM-CNR Laboratorio TASC, S.S.14. km 163.5 in Area Science Park, 34012 Trieste, Italy (literal)
- Titolo
- Introduction of Zr in nanometric periodic Mg/Co multilayers (literal)
- Abstract
- We study the introduction of a third material,
namely Zr, within a nanometric periodic Mg/Co structure
designed to work as optical component in the extreme UV
(EUV) spectral range. Mg/Co, Mg/Zr/Co, Mg/Co/Zr and
Mg/Zr/Co/Zr multilayers are designed, and then characterized
in terms of structural quality and optical performances
through X-ray and EUV reflectometry measurements, respectively.
For the Mg/Co/Zr structure, the reflectance value
is equal to 50% at 25.1 nm and 45° of grazing incidence and
reaches 51.3% upon annealing at 200°C. Measured EUV reflectivity
values of tri-layered systems are discussed in terms
of material order within a period and compared to the predictions
of the theoretical model of Larruquert. Possible applications
are pointed out. (literal)
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