http://www.cnr.it/ontology/cnr/individuo/prodotto/ID190705
Self-assembly and electron-beam-induced direct etching of suspended graphene nanostructures (Articolo in rivista)
- Type
- Label
- Self-assembly and electron-beam-induced direct etching of suspended graphene nanostructures (Articolo in rivista) (literal)
- Anno
- 2011-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1063/1.3633260 (literal)
- Alternative label
Sarah Goler 1,2, Vincenzo Piazza 2, Stefano Roddaro 1, Vittorio Pellegrini 1, Fabio Beltram 1,2, and Pasqualantonio Pingue 1 (2011)
Self-assembly and electron-beam-induced direct etching of suspended graphene nanostructures
in Journal of applied physics; The American Physical Society, College Park, MD 20740-3844 (Stati Uniti d'America)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Sarah Goler 1,2, Vincenzo Piazza 2, Stefano Roddaro 1, Vittorio Pellegrini 1, Fabio Beltram 1,2, and Pasqualantonio Pingue 1 (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://jap.aip.org/resource/1/japiau/v110/i6/p064308_s1 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1 Laboratorio NEST - Scuola Normale Superiore, and Istituto Nanoscienze - CNR, Piazza San Silvestro 12, I-56127 Pisa, Italy
1 Center for Nanotechnology Innovation @ NEST, Istituto Italiano di Tecnologia, Piazza San Silvestro 12, 56127 Pisa, Italy (literal)
- Titolo
- Self-assembly and electron-beam-induced direct etching of suspended graphene nanostructures (literal)
- Abstract
- We report on suspended single-layer graphene deposition by a transfer-printing approach based on polydimethylsiloxane stamps. The transfer printing method allows the exfoliation of graphite flakes from a bulk graphite sample and their residue-free deposition on a silicon dioxide substrate. This deposition system creates a \"blistered\" graphene surface due to strain induced by the transfer process itself. Single-layer-graphene deposition and its blistering on the substrate are demonstrated by a combination of Raman spectroscopy, scanning electron microscopy, and atomic-force microscopy measurements. Finally, we demonstrate that blister-like suspended graphene are self-supporting single-layer structures and can be flattened by employing a spatially resolved direct-lithography technique based on electron-beam induced etching. (literal)
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