http://www.cnr.it/ontology/cnr/individuo/prodotto/ID190467
Probing Charge Transport in Oxidatively Damaged DNA-Sequences under the Influence of Structural Fluctuations. (Articolo in rivista)
- Type
- Label
- Probing Charge Transport in Oxidatively Damaged DNA-Sequences under the Influence of Structural Fluctuations. (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1021/jp2091544 (literal)
- Alternative label
Lee, MH (Lee, M. H.)2,3; Brancolini, G (Brancolini, G.)1; Gutierrez, R (Gutierrez, R.)2,3; Di Felice, R (Di Felice, R.)1; Cuniberti, G (Cuniberti, G.) (2012)
Probing Charge Transport in Oxidatively Damaged DNA-Sequences under the Influence of Structural Fluctuations.
in The journal of physical chemistry. B
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Lee, MH (Lee, M. H.)2,3; Brancolini, G (Brancolini, G.)1; Gutierrez, R (Gutierrez, R.)2,3; Di Felice, R (Di Felice, R.)1; Cuniberti, G (Cuniberti, G.) (literal)
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1. CNR Inst Nanosci, Ctr S3, I-41125 Modena, Italy
2. Tech Univ Dresden, Inst Mat Sci, D-01062 Dresden, Germany
3. Tech Univ Dresden, Max Bergmann Ctr Biomat, D-01062 Dresden, Germany
4. POSTECH, Div IT Convergence Engn, Pohang 790784, South Korea
5. POSTECH, Natl Ctr Nanomat Technol, Pohang 790784, South Korea (literal)
- Titolo
- Probing Charge Transport in Oxidatively Damaged DNA-Sequences under the Influence of Structural Fluctuations. (literal)
- Prodotto di
- Autore CNR
Incoming links:
- Autore CNR di
- Prodotto
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi