http://www.cnr.it/ontology/cnr/individuo/prodotto/ID188850
Structure and morphology optimization of poly(3-hexylthiophene) thin films onto silanized silicon oxide (Articolo in rivista)
- Type
- Label
- Structure and morphology optimization of poly(3-hexylthiophene) thin films onto silanized silicon oxide (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.eurpolymj.2012.03.019 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Scavia G.; Barba L.; Arrighetti G.; Milita S.; Porzio W. (literal)
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- http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=GeneralSearch&qid=1&SID=Q2p8g1flhf19EeH@k46&page=1&doc=2 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- W.Porzio , G.Scavia ISMAC-CNR ; L. Barba, G. Arrighetti IC-CNR; S. Milita IMM-CNR (literal)
- Titolo
- Structure and morphology optimization of poly(3-hexylthiophene) thin films onto silanized silicon oxide (literal)
- Abstract
- The influence of the preparation conditions, including substrate functionalization with
common silanizers, onto structure/morphology of the overlying poly(3-hexylthiophene)
thin films has been investigated by using both grazing incidence X-ray diffraction and
atomic force microscopy. The factors determining the formation of spin-coated films suitable
for applications in field effect transistors, i.e. concentration, spin-speed, and thermal
treatment are addressed. We have established, by a tuning of the preparation and postdeposition
treatments, the optimal conditions to get films with the required structural/
morphologic features. Moreover we have shown that the macromolecules orient and organize
at the interface zone (610 nm from the interface) better than in the upper layers, i.e.
far away from the interface. (literal)
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