Thermal stability of the Co/beta-Si3N4/Si(111) interface: A photoemission study (Articolo in rivista)

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Label
  • Thermal stability of the Co/beta-Si3N4/Si(111) interface: A photoemission study (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.susc.2012.03.023 (literal)
Alternative label
  • Roberto Flammini; Frédéric Wiame; Rachid Belkhou; Amina Taleb-Ibrahimi; Paolo Moras (2012)
    Thermal stability of the Co/beta-Si3N4/Si(111) interface: A photoemission study
    in Surface science; ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Roberto Flammini; Frédéric Wiame; Rachid Belkhou; Amina Taleb-Ibrahimi; Paolo Moras (literal)
Pagina inizio
  • 1215 (literal)
Pagina fine
  • 1220 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 606 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 15-16 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR-IMIP, Istituto Metodologie Inorganiche e dei Plasmi, Area della Ricerca di Roma 1, Via Salaria km 29.300, CP 10, 00016-Monterotondo Scalo (RM), Italy Laboratoire de Physico-Chimie des Surfaces, CNRS-ENSCP (UMR 7045), Ecole Nationale Supérieure de Chimie de Paris (Chimie ParisTech), 11 rue Pierre et Marie Curie, F-75231 Paris cedex 05, France Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, B.P. 48 F, 91192 Gif Sur Yvette, France CNR-ISM, Istituto di Struttura della Materia, Area Science Park, S.S. 14, km. 163,5, 34149 Basovizza (TS), Italy (literal)
Titolo
  • Thermal stability of the Co/beta-Si3N4/Si(111) interface: A photoemission study (literal)
Abstract
  • The thermal stability of the Co/beta-Si3N4/Si(111) interface has been studied by high-resolution photoemission spectroscopy in a temperature range extending from room temperature to 650 degrees C. It is demonstrated the ability of a very thin crystalline buffer layer of silicon nitride to prevent the interfacial reaction between cobalt and silicon at room temperature. The behaviour of the interface at higher temperature shows the formation of cobalt silicides already at 300 degrees C. Moreover, the presence of new components in the decomposition of the photoemission spectra is discussed in the light of the existing literature (literal)
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