http://www.cnr.it/ontology/cnr/individuo/prodotto/ID18799
Capacitance of Josephson junctions made on bicrystalline substrates of different geometries (Articolo in rivista)
- Type
- Label
- Capacitance of Josephson junctions made on bicrystalline substrates of different geometries (Articolo in rivista) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1103/PhysRevB.71.014501 (literal)
- Alternative label
M. A. Navacerrada,1,2 M. L. Lucia,2 L. L. Sanchez-Soto,3 F. Sanchez-Quesada,2 E. Sarnelli,4 and G. Testa4 (2005)
Capacitance of Josephson junctions made on bicrystalline substrates of different geometries
in Physical review. B, Condensed matter and materials physics (Online)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- M. A. Navacerrada,1,2 M. L. Lucia,2 L. L. Sanchez-Soto,3 F. Sanchez-Quesada,2 E. Sarnelli,4 and G. Testa4 (literal)
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- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1Centro de Estudios Superiores Felipe II (Universidad Complutense), C/ Capitán 39, 28300 Aranjuez (Madrid), Spain
2Departamento de Física Aplicada III (Electricidad y Electrónica), Facultad de CC. Físicas, Universidad Complutense,
Avda. Complutense s/n, 28040 Madrid, Spain
3Departamento de Óptica, Facultad de CC. Físicas, Universidad Complutense, Avda. Complutense s/n, 28040 Madrid, Spain
4Istituto di Cibernetica \"E. Caianello\" CNR, Via Campi Flegrei, 34 Pozzuoli, Italy (literal)
- Titolo
- Capacitance of Josephson junctions made on bicrystalline substrates of different geometries (literal)
- Abstract
- The electromagnetic parameters of YBa2Cu3O7-x (YBCO) grain boundary Josephson junctions (JJs) fabricated
on four different tilt bicrystal geometries: 12° [001] asymmetric, 24° [001] symmetric, 24° [001] asymmetric,
and 45° [100] asymmetric, have been studied. While the Swihart velocity sc¯d is slightly affected by the
nature of the barrier and mainly fixed by the junction width, a notable influence of the barrier structure, of the
geometry of the bicrystal substrate, on the relative dielectric constant to the barrier thickness ratio s«/ td values
has been found. Interesting barrier information can be deduced from the study of the dependence of the
junction capacitance on the junction resistance. We have observed that the capacitance values deduced by
means of Fiske steps in YBCO 24° [001] symmetric and 45° [100] asymmetric JJs scales with junction
resistance in the opposite direction. This result could reveal the presence of a tunnel barrier in the YBCO 45°
[100] asymmetric JJs. On the other hand, different capacitance values have been obtained by means of Fiske
steps and hysteresis observed in the current-voltage characteristics in 45° [100] asymmetric JJs. An interpretation
of this result can be made taking into account the contribution of the depleted YBCO layers close to the
crystallographic grain boundary. (literal)
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