MICROANALYSIS OF MINERALS FOR BORON BY SREF, SIMS AND EMPA - A COMPARATIVE-STUDY (Articolo in rivista)

Type
Label
  • MICROANALYSIS OF MINERALS FOR BORON BY SREF, SIMS AND EMPA - A COMPARATIVE-STUDY (Articolo in rivista) (literal)
Anno
  • 1995-01-01T00:00:00+01:00 (literal)
Alternative label
  • HAWTHORNE F.C. 1; COOPER M. 1; BOTTAZZI P. 2; OTTOLINI L. 2; ERCIT T.S. 3; GREW E.S. 4 (1995)
    MICROANALYSIS OF MINERALS FOR BORON BY SREF, SIMS AND EMPA - A COMPARATIVE-STUDY
    in Canadian mineralogist
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • HAWTHORNE F.C. 1; COOPER M. 1; BOTTAZZI P. 2; OTTOLINI L. 2; ERCIT T.S. 3; GREW E.S. 4 (literal)
Pagina inizio
  • 389 (literal)
Pagina fine
  • 397 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 33 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. UNIV MANITOBA,DEPT GEOL SCI,WINNIPEG,MB R3T 2N2,CANADA; 2. CNR,CTR STUDIO CRISTALLOCHIM & CRISTALLOGRAFIA,I-27100 PAVIA,ITALY; 3. CANADIAN MUSEUM NAT,DIV RES,OTTAWA,ON K1P 6P4,CANADA; 4. UNIV MAINE,DEPT GEOL SCI,ORONO,ME 04469 (literal)
Titolo
  • MICROANALYSIS OF MINERALS FOR BORON BY SREF, SIMS AND EMPA - A COMPARATIVE-STUDY (literal)
Abstract
  • Kornerupine, (square,Mg,Fe)(Mg,Fe,Al)(9)(Si,Al,B)(5)(O,OH,F)(22), contains from 0 to 4 wt% B2O3, and is an ideal material for the evaluation of accuracy and precision of different micro-methods for boron analysis. We have analyzed 32 well-characterized crystals of kornerupine for their B content by SREF (crystal-Structure REFinement), SIMS (Secondary-Ion Mass Spectrometry) and EMPA (Electron-MicroProbe Analysis). The physical phenomena underlying these three analytical methods are entirely different, and hence there should be no systematic errors common to all three methods; this allows evaluation of the accuracy and precision of each method. In the range 0.5-4.4 wt% B2O3, the precisions of the three methods are as follows: SREF (from least-squares refinement) 1-2% relative, 0.01-0.08 wire absolute; SIMS (from reproducibility) 1-2% relative, 0.01-0.08 wt% absolute; EMPA (from counting statistics) 5-22% relative, 0.1-0.2 wt% absolute. Comparison of SREF and SIMS results shows them to agree on average within 3% relative. Hence SREF and SIMS are accurate within the limits of their assigned precision. Comparison of SREF and EMPA results shows a slight systematic difference between the two sets of results, the EMPA values being 7% higher than the SREF (and SIMS) results. (literal)
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