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Early stages of formation of the Ag-Ni(111) interface studied by grazing incidence x-ray diffraction and x-ray photoelectron diffraction (Articolo in rivista)

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Early stages of formation of the Ag-Ni(111) interface studied by grazing incidence x-ray diffraction and x-ray photoelectron diffraction (Articolo in rivista) (literal)

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Alternative label

Chambon, C (Chambon, C.)1,3; Coati, A (Coati, A.)1; Sauvage-Simkin, M (Sauvage-Simkin, M.)1,2; Garreau, Y (Garreau, Y.)1,3; Creuze, J (Creuze, J.)4; Verdini, A (Verdini, A.)5; Cossaro, A (Cossaro, A.)5; Floreano, L (Floreano, L.)5; Morgante, A (Morgante, A.)5,6 (2011)
Early stages of formation of the Ag-Ni(111) interface studied by grazing incidence x-ray diffraction and x-ray photoelectron diffraction
in Physical review. B, Condensed matter and materials physics
(literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

Chambon, C (Chambon, C.)1,3; Coati, A (Coati, A.)1; Sauvage-Simkin, M (Sauvage-Simkin, M.)1,2; Garreau, Y (Garreau, Y.)1,3; Creuze, J (Creuze, J.)4; Verdini, A (Verdini, A.)5; Cossaro, A (Cossaro, A.)5; Floreano, L (Floreano, L.)5; Morgante, A (Morgante, A.)5,6 (literal)

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1. Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France 2. Associate CNR IOM, Lab TASC, Trieste, Italy 3. Univ Paris Diderot, MPQ, CNRS, UMR 7162, F-75205 Paris 13, France 4. Univ Paris 11, LEMHE ICMMO, F-91405 Orsay, France 5. CNR IOM, Lab TASC, I-34012 Trieste, Italy 6. Univ Trieste, Dipartimento Fis, I-34127 Trieste, Italy (literal)

Titolo

Early stages of formation of the Ag-Ni(111) interface studied by grazing incidence x-ray diffraction and x-ray photoelectron diffraction (literal)

Abstract

Ultra-thin Ag/Ni(111) reconstructed interfaces have been revisited by a combination of in-situ grazing incidence x-ray diffraction (GIXD) and x-ray photoelectron diffraction (XPD) in order to determine the growth mode and to evaluate the interface spacing. Evidence for predominance of single-layer growth in the early stages was obtained through the analysis of the x-ray diffraction rods from the Ag/Ni(111) (root 52 x root 52)R13.9 degrees reconstructed interface, whereas photoelectron diffraction patterns could reveal traces of second-layer Ag scatterers before full wetting of the substrate. Refinement of the atomic coordinates provided by quenched molecular dynamics simulation on the basis of the new x-ray data set enabled us to assess the Ag/Ni average interplanar distance, which was found unexpanded at 2.44 +/- 0.07 angstrom, in contrast with recent determination by low-energy electron diffraction and microscopy. For increasing deposited amounts, both GIXD and XPD showed the expected features of two- and three-layer silver epitaxial overgrowths. (literal)

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