http://www.cnr.it/ontology/cnr/individuo/prodotto/ID184407
Wafer-level testing of thermopile IR detectors (Contributo in atti di convegno)
- Type
- Label
- Wafer-level testing of thermopile IR detectors (Contributo in atti di convegno) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1109/ICSENS.2005.1597904 (literal)
- Alternative label
Mancarella F; Roncaglia A; Passini M; Sanmartin M; Cardinali GC; Severi M (2005)
Wafer-level testing of thermopile IR detectors
in IEEE Sensors 2005, Irvine, CA, Oct. 30 2005-Nov. 3 2005
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Mancarella F; Roncaglia A; Passini M; Sanmartin M; Cardinali GC; Severi M (literal)
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- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=1597904&contentType=Conference+Publications&searchField%3DSearch_All%26queryText%3DWafer-level+testing+of+thermopile+IR+detectors (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloVolume
- Proceedings of IEEE Sensors 2005 (literal)
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- CNR IMM Bologna (literal)
- Titolo
- Wafer-level testing of thermopile IR detectors (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#isbn
- Abstract
- We propose a method to characterize the main figures of merit of IR thermopile detectors by means of electrical measurements performed at the wafer level. Finite element simulations are adopted in order to compare the results of wafer-level measurements with the actual device responsivity as expected by optical measurements. The employed finite-element model is validated by comparison with experimental data obtained on a micromachined thermal test structure (literal)
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