1.31 mu m InGaAs quantum dot light-emitting diodes grown directly in a GaAs matrix by metalorganic chemical-vapor deposition (Articolo in rivista)

Type
Label
  • 1.31 mu m InGaAs quantum dot light-emitting diodes grown directly in a GaAs matrix by metalorganic chemical-vapor deposition (Articolo in rivista) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.1687979 (literal)
Alternative label
  • Maria Teresa Todaro; Milena De Giorgi; Vittorianna Tasco; Massimo De Vittorio; Roberto Cingolani; Adriana Passaseo (2004)
    1.31 mu m InGaAs quantum dot light-emitting diodes grown directly in a GaAs matrix by metalorganic chemical-vapor deposition
    in Applied physics letters (Online)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Maria Teresa Todaro; Milena De Giorgi; Vittorianna Tasco; Massimo De Vittorio; Roberto Cingolani; Adriana Passaseo (literal)
Pagina inizio
  • 2482 (literal)
Pagina fine
  • 2484 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 84 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • NNL-INFM-Unità di Lecce-Dipartimento di Ingegneria dell' Innovazione, Università di Lecce, Via Arnesano, 73100 Lecce, Italy (literal)
Titolo
  • 1.31 mu m InGaAs quantum dot light-emitting diodes grown directly in a GaAs matrix by metalorganic chemical-vapor deposition (literal)
Abstract
  • We investigate the optical properties of light-emitting diodes (LEDs) operating at 1.3 ?m embedding, in the intrinsic region, quantum dots (QDs) directly grown by metalorganic chemical-vapor deposition in a GaAs matrix, without indium in the barrier. The device characterization shows a full width at half maximum of the ground state emission as narrow as 24 meV at room temperature and a quenching of the emission between 30 K and room temperature as low as 2.75. Despite the low dot density (1.6×109 cm-2), the external quantum efficiency of our devices is 0.03%. This indicates that the individual QD efficiency of our devices is about 30% higher than that reported in the literature for state of the art InGaAs/InGaAs QD LEDs. (literal)
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