Gauss' law of error revisited in the framework of Sharma-Taneja-Mittal information measure (Articolo in rivista)

Type
Label
  • Gauss' law of error revisited in the framework of Sharma-Taneja-Mittal information measure (Articolo in rivista) (literal)
Anno
  • 2009-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.2478/s11534-009-0002-3 (literal)
Alternative label
  • A.M. Scarfone; H. Suyari; T. Wada (2009)
    Gauss' law of error revisited in the framework of Sharma-Taneja-Mittal information measure
    in Central European Journal of Physics (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • A.M. Scarfone; H. Suyari; T. Wada (literal)
Pagina inizio
  • 414 (literal)
Pagina fine
  • 420 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 7 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 3 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Istituto Nazionale per la Fisica della Materia (CNR{INFM) and Dipartimento di Fisica Politecnico di Torino, I-10129 Torino, Italy; Graduate School of Advanced Integration Science, Chiba University, 263-8522 Chiba, Japan; Department of Electrical and Electronic Engineering, Ibaraki University, 316-8511 Hitachi, Japan (literal)
Titolo
  • Gauss' law of error revisited in the framework of Sharma-Taneja-Mittal information measure (literal)
Abstract
  • We reformulate the Gauss' law of error in presence of correlations which are taken into account by means of a deformed product arising in the framework of the Sharma-Taneja-Mittal measure. Having reviewed the main proprieties of the generalized product and its related algebra, we derive, according to the Maximum Likelihood Principle, a family of error distributions with an asymptotic power-law behavior. (literal)
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