A highly tunable heterostructure metal-semiconductor-metal capacitor utilizing embedded 2-dimensional charge (Articolo in rivista)

Type
Label
  • A highly tunable heterostructure metal-semiconductor-metal capacitor utilizing embedded 2-dimensional charge (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.3702466 (literal)
Alternative label
  • Dianat P, Prusak RW, Galo E, Cola A, Persano A, Quaranta F, Nabet B (2012)
    A highly tunable heterostructure metal-semiconductor-metal capacitor utilizing embedded 2-dimensional charge
    in Applied physics letters
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Dianat P, Prusak RW, Galo E, Cola A, Persano A, Quaranta F, Nabet B (literal)
Pagina inizio
  • 153505-1 (literal)
Pagina fine
  • 153505-3 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://apl.aip.org/resource/1/applab/v100/i15/p153505_s1 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 100 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 3 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 15 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • [Dianat P; Prusak R W; Galo E; Nabet B] Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania 19104, USA; [Cola A; Persano A; Quaranta F] Institute for Microelectronics and Microsystems-Unit of Lecce, National Council of Research (IMM-CNR); Via Monteroni, Lecce 73100, Italy (literal)
Titolo
  • A highly tunable heterostructure metal-semiconductor-metal capacitor utilizing embedded 2-dimensional charge (literal)
Abstract
  • We report on a variable capacitor that is formed between Schottky contacts and the two dimensional electron gas (2DEG) in a planar metal-semiconductor-metal structure. Device capacitance at low bias is twice the series capacitance of anode and cathode, enhancing to a maximum value, Cmax, at a threshold voltage, before reaching a minimum, Cmin, lower than the geometric capacitance of the coplanar contacts, thus resulting in ultra high Cmax=Cmin tuning ratio. Sensitivity, the normalized change of capacitance with voltage, is also very large. The dense reservoir of the 2DEG charge maintained between contacts is shown to be responsible for this remarkable performance. (literal)
Prodotto di
Autore CNR
Insieme di parole chiave

Incoming links:


Prodotto
Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Insieme di parole chiave di
data.CNR.it