High-resolution 3D survey of artworks (Articolo in rivista)

Type
Label
  • High-resolution 3D survey of artworks (Articolo in rivista) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1117/12.545660 (literal)
Alternative label
  • Fontana R.; Gambino M.C.; Mazzotta C.; Greco M.; Pampaloni E.; Pezzati L. (2004)
    High-resolution 3D survey of artworks
    in Proceedings of SPIE, the International Society for Optical Engineering
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Fontana R.; Gambino M.C.; Mazzotta C.; Greco M.; Pampaloni E.; Pezzati L. (literal)
Pagina inizio
  • 719 (literal)
Pagina fine
  • 726 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://spiedigitallibrary.org/proceedings/resource/2/psisdg/5457/1/719_1 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 5457 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 8 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Istituto Nazionale di Ottica Applicata, largo E. Fermi 6, 50125 Firenze, Italy Università degli Studi di Lecce, Dipartimento di Beni Culturali, via D. Birago 64, 73100 Lecce, Italy (literal)
Titolo
  • High-resolution 3D survey of artworks (literal)
Abstract
  • The aim of this work is to show how 3D techniques can be used to integrate standard diagnostic ones, adding useful and powerful tools for the restorers. A 3D model allows both to monitor restoration processes and to keep trace of any significant modification of an artwork. We present 3D measurements carried out on different kind of samples: a statue, a painting, a xylography board and two ancient coins. These surveys were carried out by means of a high-resolution laser micro-profilometer developed by the Art Diagnostic Group of the National Institute of Applied Optics. It is composed of a commercial distance meter mounted on a scanning device and allows dense data sampling with high quota resolution and accuracy. (literal)
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