SIMS characterization of La0.7Sr0.3MnO3 films for solid oxide fuel cell applications (Articolo in rivista)

Type
Label
  • SIMS characterization of La0.7Sr0.3MnO3 films for solid oxide fuel cell applications (Articolo in rivista) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1002/adic.200590046 (literal)
Alternative label
  • S. Barison; M. Battagliarin; S. Daolio; M. Fabrizio; E. Miorin (2005)
    SIMS characterization of La0.7Sr0.3MnO3 films for solid oxide fuel cell applications
    in Annali di chimica (Testo stamp.)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • S. Barison; M. Battagliarin; S. Daolio; M. Fabrizio; E. Miorin (literal)
Pagina inizio
  • 395 (literal)
Pagina fine
  • 403 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://onlinelibrary.wiley.com/doi/10.1002/adic.200590046/abstract (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 95 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 6 (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Consiglio Nazionale Delle Ricerche, Istituto Per l'Energetica e le Interfasi, Corso Stati Uniti 4, 35127 Padova, Italy (literal)
Titolo
  • SIMS characterization of La0.7Sr0.3MnO3 films for solid oxide fuel cell applications (literal)
Abstract
  • Among solid oxides exploited to prepare efficient fuel cells, La 1-xSrxMnO3 manganites have been widely studied and used as cathodes, because of their high conductivity at the working temperatures, good thermal stability and compatibility with other cell components. A fundamental goal in solid oxide fuel cells technology consists in lowering the normal operating temperatures, e.g. increasing the surface/volume ratio of electrodic materials, so as to enhance their catalytic performances. In this work, the preparation of high surface area La1-xSr xMnO3 (x ? 0.3) films on silicon wafers by the nitrate-citrate Pechini process is described. The films were characterized by X-ray diffraction, Atomic Force Microscopy and Secondary Ion Mass Spectrometry. Good quality nanostructured perovskite-type films were obtained. SIMS methodology enabled to show the surface and in-depth coatings composition and residual contaminants. Moreover, it allowed defining the best synthesis conditions for complete in-depth decomposition of precursors and obtaining homogeneously thick coatings. (literal)
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