http://www.cnr.it/ontology/cnr/individuo/prodotto/ID179838
Reconstruction dependent reactivity of As-decapped In0.53Ga0.47As(001) surfaces and its influence on the electrical quality of the interface with Al2O3 grown by atomic layer deposition (Articolo in rivista)
- Type
- Label
- Reconstruction dependent reactivity of As-decapped In0.53Ga0.47As(001) surfaces and its influence on the electrical quality of the interface with Al2O3 grown by atomic layer deposition (Articolo in rivista) (literal)
- Anno
- 2011-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1063/1.3659688 (literal)
- Alternative label
A. Molle, L. Lamagna, C. Grazianetti, G. Brammertz, C. Merckling, M. Caymax, S. Spiga, M. Fanciull (2011)
Reconstruction dependent reactivity of As-decapped In0.53Ga0.47As(001) surfaces and its influence on the electrical quality of the interface with Al2O3 grown by atomic layer deposition
in Applied physics letters (Online)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- A. Molle, L. Lamagna, C. Grazianetti, G. Brammertz, C. Merckling, M. Caymax, S. Spiga, M. Fanciull (literal)
- Pagina inizio
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Laboratorio MDM, IMM-CNR, via C. Olivetti 2, I-20864 Agrate Brianza (MB), Italy;
IMEC, Kapeldreef 75, 3001 Leuven, Belgium;
Dipartimento di Scienza dei Materiali, Universita` degli Studi di Milano Bicocca, Milano, Italy (literal)
- Titolo
- Reconstruction dependent reactivity of As-decapped In0.53Ga0.47As(001) surfaces and its influence on the electrical quality of the interface with Al2O3 grown by atomic layer deposition (literal)
- Abstract
- Tuning the desorption temperature of an As cap layer allows to achieve In0.53Ga0.47As(001)
surfaces with (2?4) and (4?2) reconstructions which exhibit different chemical reactivity upon
exposure in atmospheric pressure. Trimethyl-Al based atomic layer deposition of Al2O3 films on
the two exposed surfaces causes a non-equivalent interface composition. This behavior is
associated with a worse electrical quality of the interface with the exposed (4?2) In0.53Ga0.47As
reconstruction. (literal)
- Prodotto di
- Autore CNR
Incoming links:
- Autore CNR di
- Prodotto
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi