Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared (Articolo in rivista)

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Label
  • Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared (Articolo in rivista) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1140/epje/i2004-10014-4 (literal)
Alternative label
  • V. Tkachenko 1; A. Marino 1, 2; F. Vita 1, 2; F. D'Amore 3; L. De Stefano 4; M. Malinconico 5; M. Rippa 2; G. Abbate 1, 2 (2004)
    Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared
    in The European physical journal. E, Soft matter (Print); Società Italiana di Fisica, Bologna (Italia); EDP Sciences, Les Ulis Cedex (Francia); Springer-Verlag, Berlin/Heidelberg (Germania)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • V. Tkachenko 1; A. Marino 1, 2; F. Vita 1, 2; F. D'Amore 3; L. De Stefano 4; M. Malinconico 5; M. Rippa 2; G. Abbate 1, 2 (literal)
Pagina inizio
  • 185 (literal)
Pagina fine
  • 192 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://dx.doi.org/10.1140/epje/i2004-10014-4 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 14 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 8 (literal)
Note
  • Scopu (literal)
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  • 1 INFM Unità di Napoli c/o Dipartimento di Scienze Fisiche, Università di Napoli Federico II, via Cintia, Monte S'Angelo, 80126 Napoli, Italy; 2 Dipartimento di Scienze Fisiche, Università di Napoli Federico II, via Cintia, Monte S'Angelo, 80126 Napoli, Italy; 3 CoreCom, via G. Colombo 81, 20133 Milano, Italy; 4 CNR-IMM, via P. Castellino 111, 80131 Napoli, Italy; 5 CNR-ICTP, via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy (literal)
Titolo
  • Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared (literal)
Abstract
  • In this work, we propose spectroscopic ellipsometry as a suitable method for measuring optical properties in soft materials, polymers and liquid crystals, specially selected for use in photonics applications. We show the results of our measurements on some multilayered samples, in the range from visible to the near-IR region, of interest for telecom applications. We point out potentialities and limits of the technique and compare the obtained results with another experimental method, the m-lines spectroscopy, and/or with existing data in the literature. The results about the optical parameters for the analysed materials (the nematic liquid crystal 5CB, one commercial and one lab made optical polymer, and an Indium Tin Oxide film) are useful and interesting by themselves. In fact, as a paradigmatic example, we briefly discuss how an incomplete knowledge of this kind of data can lead to a wrong design of a Bragg grating device. However, more than in the provided data, we put the interest of the present analysis in the warnings about spectroscopic ellipsometry utilization and eventually the necessity of getting complementary information. (literal)
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