SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range (Articolo in rivista)

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Label
  • SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range (Articolo in rivista) (literal)
Anno
  • 2006-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.2372731 (literal)
Alternative label
  • Ghiringhelli, G; Piazzalunga, A ; Dallera, C; Trezzi, G ; Braicovich, L; Schmitt, T ; Strocov, VN ; Betemps, R ; Patthey, L ; Wang, X ; Grioni, M (2006)
    SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range
    in Review of scientific instruments; American Institute Of Physics (AIP), Melville (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Ghiringhelli, G; Piazzalunga, A ; Dallera, C; Trezzi, G ; Braicovich, L; Schmitt, T ; Strocov, VN ; Betemps, R ; Patthey, L ; Wang, X ; Grioni, M (literal)
Pagina inizio
  • 113108-1 (literal)
Pagina fine
  • 113108-9 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 77 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 9 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milano, Italy Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland Institut de Physique des Nanostructures, Ecole Polytechnique Fédéderale de Lausanne, CH-1015 Lausanne, Switzerland (literal)
Titolo
  • SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range (literal)
Abstract
  • We present a 5 m long spectrometer for soft x rays to be used at a synchrotron radiation beamline for resonant x-ray emission spectroscopy and resonant inelastic x-ray scattering in the 400-1600 eV energy range. It is based on a variable line spacing spherical grating àverage groove density of 3200 mm-1, R=58.55 m? and a charge coupled device two dimensional detector. With an x-ray spot on the sample of 10 ?m, the targeted resolving power is higher than 10 000 at all energies below 1100 eV and better than 7000 at 1500 eV. The off-line tests made with Al and Mg K?1,2 fluorescence emissions indicate that the spectrometer can actually work at 12 000 and 17 000 resolving power at the L3 edges of Cu ?930 eV? and of Ti ?470 eV?, respectively. SAXES ?superadvanced x-ray emission spectrometer? is mounted on a rotating platform allowing to vary the scattering angle from 25° to 130°. The spectrometer will be operational at the ADRESS àdvanced resonant spectroscopies? beamline of the Swiss Light Source from 2007. (literal)
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