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Electron Backscattering Diffraction and X-ray Diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals (Articolo in rivista)

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Electron Backscattering Diffraction and X-ray Diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals (Articolo in rivista) (literal)

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R. Ciancio; H. Pettersson; R. Fittipaldi; A. Kalabukhov; P. Orgiani; A. Vecchione; Y. Maeno; S. Pace; E. Olsson (2011)
Electron Backscattering Diffraction and X-ray Diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals
in Micron (1993); Pergamon-Elsevier Science Ltd., Oxford (Regno Unito)
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R. Ciancio; H. Pettersson; R. Fittipaldi; A. Kalabukhov; P. Orgiani; A. Vecchione; Y. Maeno; S. Pace; E. Olsson (literal)

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CNR-SPIN and Department of Physics \"E.R. Caianiello\", University of Salerno, I-84081 Baronissi (SA), Italy Department of Applied Physics, Microscopy and Microanalysis, Chalmers University of Technology, SE-41296 GÄoteborg, Sweden CNR-IOM, TASC Laboratory, Area Science Park - Basovizza, I-34149 Trieste, Italy Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 GÄoteborg, Sweden CNR-SPIN, I-84081 Baronissi (SA), Italy Department of Physics, Graduate School of Science, Kyoto University, Kyoto 606-8502, Japan (literal)

Titolo

Electron Backscattering Diffraction and X-ray Diffraction studies of interface relationships in Sr3Ru2O7/Sr2RuO4 eutectic crystals (literal)

Abstract

Sr3Ru2O7/Sr2RuO4 eutectic system is investigated by electron backscattering diffraction (EBSD) and Xray diffraction (XRD). The eutectic growth enables the solidification of the two phases in an ordered lamellar pattern extending along the growth direction, namely the b-axis direction. The eutectic material thus provides in the a-c plane two distinct interfaces having different microstructures with respect to the growth direction. Our analysis shows that, across the inplane c-axis direction (characterized by a poor lattice matching), the b-axis orientation is not constant at the individual interfaces, showing an orientation spread of about 5o. However, across the in-plane a-axis direction (characterized by a good lattice matching), the b-axis orientation does not change within a few tenths of degree (about 0.25o). Such information at nanoscale is also verified on a macroscopic level by standard XRD investigation. (literal)

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