Si/SiO2 core shell clusters probed by Raman spectroscopy (Articolo in rivista)

Type
Label
  • Si/SiO2 core shell clusters probed by Raman spectroscopy (Articolo in rivista) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1140/epjb/e2005-00274-4 (literal)
Alternative label
  • Faraci, G; Gibilisco, S; Russo, P; Pennisi, AR; Compagnini, G; Battiato, S; Puglisi, R; La Rosa, S (2005)
    Si/SiO2 core shell clusters probed by Raman spectroscopy
    in The European physical journal. B, Condensed matter physics (Print); SPRINGER, 233 SPRING ST, NEW YORK, NY 10013 (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Faraci, G; Gibilisco, S; Russo, P; Pennisi, AR; Compagnini, G; Battiato, S; Puglisi, R; La Rosa, S (literal)
Pagina inizio
  • 457 (literal)
Pagina fine
  • 461 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://apps.webofknowledge.com/full_record.do?product=WOS&search_mode=DaisyMultiClustViewRecords&qid=74&SID=T1iOe4GJAaI@nJLGL4B&page=2&doc=12 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 46 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 5 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 4 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. Catania Univ, Dipartimento Fis & Astron, I-95123 Catania, Italy 2. Ist Nazl Fis Mat, MATIS, I-95123 Catania, Italy 3. Catania Univ, Dipartimento Sci Chim, I-95123 Catania, Italy 4. CNR, IMM, Catania, Italy 5. Sincrotrone Trieste, Elett, I-34012 Trieste, Italy (literal)
Titolo
  • Si/SiO2 core shell clusters probed by Raman spectroscopy (literal)
Abstract
  • Using a pulsed microplasma source, clusters were produced through the ablation of a Si cathode and successive supersonic expansion. The Si cluster beam was deposited onto different substrates and the partial oxidation of the cluster surface avoided the growth of large agglomerates, preserving their nanocrystalline morphology. Micro-Raman spectroscopy was used for an accurate size diagnosis of the deposited nanoparticles. The size of the Si dots ranges between 2 and about 15 nm. The Si dots appear to have a Si oxide shell, as confirmed also by structural and compositional analysis through transmission electron microscopy and atomic force microscopy. Double Raman peaks were attributed to small Si agglomerates having a thin substoichiometric Si-O interface. (literal)
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