Characterization of off-axis MgB2 epitaxial thin films for planar junctions (Articolo in rivista)

Type
Label
  • Characterization of off-axis MgB2 epitaxial thin films for planar junctions (Articolo in rivista) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.2140473 (literal)
Alternative label
  • M.Iavarone; G.Karapetrov; A.Menzel; V.Komanicky; H.You; W.K.Kwok; P.Orgiani; V.Ferrando; X.X.Xi (2005)
    Characterization of off-axis MgB2 epitaxial thin films for planar junctions
    in Applied physics letters; American Institute Of Physics (AIP), Melville (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • M.Iavarone; G.Karapetrov; A.Menzel; V.Komanicky; H.You; W.K.Kwok; P.Orgiani; V.Ferrando; X.X.Xi (literal)
Pagina inizio
  • 242506-1 (literal)
Pagina fine
  • 242506-3 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://link.aip.org/link/applab/v87/i24/p242506 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 87 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 3 (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA Penn State Univ, Dept Phys, University Pk, PA 16802 USA Univ Naples, INFM Coherentia, I-80125 Naples, Italy Univ Genoa, INFM, LAMIA, I-16146 Genoa, Italy Penn State Univ, Dept Phys, University Pk, PA 16802 USA Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA (literal)
Titolo
  • Characterization of off-axis MgB2 epitaxial thin films for planar junctions (literal)
Abstract
  • Using scanning tunneling spectroscopy, we perform a full mapping of the quasiparticle density of states of magnesium diboride (MgB2) epitaxial thin films grown on (110) yttrium stabilized zirconia (YSZ) by hybrid physical-chemical vapor deposition. The films have critical temperatures of 40 K. X-ray measurements show an epitaxial MgB2 growth having the c-axis tilted by 32 degrees with respect to the normal to the substrate, consistent with the atomic force microscopy images of the sample. Scanning tunneling spectroscopy clearly finds that the spectroscopic peak associated to the pi gap is reduced on most of the film surface and the feature representative of the sigma gap is present, with different intensity, on the majority of the sample's surface, which is consistent with x-ray measurements. (literal)
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