http://www.cnr.it/ontology/cnr/individuo/prodotto/ID176346
Selective Doping of Silicon Nanowires by Means of Electron Beam Stimulated Oxide Etching (Articolo in rivista)
- Type
- Label
- Selective Doping of Silicon Nanowires by Means of Electron Beam Stimulated Oxide Etching (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1021/nl2045183 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- G. Penneli;M. Totaro; M. Piotto (literal)
- Pagina inizio
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
- Note
- ISI Web of Science (WOS) (literal)
- Scopus (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Dipartimento di Ingegneria della Informazione, Universita? di Pisa, Via G.Caruso, I-56122 Pisa, Italy.
IEIIT - Pisa, CNR, Via G.Caruso, I-56122 Pisa, Italy. (literal)
- Titolo
- Selective Doping of Silicon Nanowires by Means of Electron Beam Stimulated Oxide Etching (literal)
- Abstract
- Direct patterning of silicon dioxide by means of electron beam
stimulated etching is shown, and a full characterization of exposure dose is
presented. For its high dose, this technique is unsuitable for large areas but can
be usefully employed like a precision scalpel for removing silicon dioxide by
well-localized points. In this work, this technique is applied to the definition of
windows through the oxide surrounding top down fabricated n-doped silicon
nanowires. These windows will be employed for a selective doping of the
nanowire by boron diffusion. In this way, pn junctions can be fabricated in welllocalized
points in the longitudinal direction of the nanowire, and an electrical
contact to the different junctions can be provided. Electrical I-V characteristics
of a nanowire with pn longitudinal junctions are reported and discussed. (literal)
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