http://www.cnr.it/ontology/cnr/individuo/prodotto/ID176148
Structural and optical characterization of MOVPE grown InGaP/GaAs MQWs for advanced photovoltaic devices (Articolo in rivista)
- Type
- Label
- Structural and optical characterization of MOVPE grown InGaP/GaAs MQWs for advanced photovoltaic devices (Articolo in rivista) (literal)
- Anno
- 2009-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.jcrysgro.2009.07.015 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- M. Longo a; A.Parisini b;, L.Tarricone b; S.Vantaggio b; C.Bocchi c; F.Germini c; L. Lazzarini c (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- a CNR-INFM, Dipartimento di Fisica,Universita di Parma,Viale G.P.Usberti,7/A,43100 Parma, Italy
b CNISM, Dipartimento di Fisica, Universita di Parma, Viale G.P. Usberti,7/A, 43100 Parma, Italy
c CNR-IMEM Parco Area delle Scienze 37/A, 43010 Loc.Fontanini-Parma, Italy (literal)
- Titolo
- Structural and optical characterization of MOVPE grown InGaP/GaAs MQWs for advanced photovoltaic devices (literal)
- Abstract
- The optimization of the electronic properties of InGaP/GaAsMQWs,to be inserted in multilayers
heterostructure fo rnovel photovoltaic devices,was performed by structural,optical and photoelectrical
measurements. Different sequences of nominally undoped InGaP and GaAs alternated layers were
grown by low-pressure metalorganic vapour phase epitaxy, employing tertiarybutylarsine and
tertiarybutylphosphine as metalorganic precursors for theV-group elements. In order to minimize
the As/P exchange effect, the interface In segregation,and to control the whole lattice matching, single
and multi-quantum wells (MQWs) with different: (i) periods, (ii) well widths, (iii) growth temperatures,
(iv) gas-switching sequences at the interfaces and (v) indium concentrations in the InGaP alloy,were
prepared and investigated.The interface sharpness and the compositional fluctuation of thick MQW
region containing up to 40 well-barrier sequences were investigated for the modelling, realization and
evaluation of test structures based on low-dimensional systems for third generation solar cells. (literal)
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