Weak localization and 1/f noise in Nd1.83Ce0.17CuO4+? thin films (Articolo in rivista)

Type
Label
  • Weak localization and 1/f noise in Nd1.83Ce0.17CuO4+? thin films (Articolo in rivista) (literal)
Anno
  • 2009-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1103/PhysRevB.80.224405 (literal)
Alternative label
  • 1 C. Barone; 2 A. Guarino;2 A. Nigro;2 A. Romano; and 1 Sergio Pagano (2009)
    Weak localization and 1/f noise in Nd1.83Ce0.17CuO4+? thin films
    in Physical review. B, Condensed matter and materials physics; American Physical Society (APS), College Pk (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • 1 C. Barone; 2 A. Guarino;2 A. Nigro;2 A. Romano; and 1 Sergio Pagano (literal)
Pagina inizio
  • 2244051 (literal)
Pagina fine
  • 2244057 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://prb.aps.org/abstract/PRB/v80/i22/e224405 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 80 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 7 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1 CNR-INFM Coherentia and Dipartimento di Matematica e Informatica, Universit√† di Salerno, Fisciano, Salerno, Italy 2 CNR-INFM SuperMat and Dipartimento di Fisica \"E.R. Caianiello,\" Universit√† di Salerno, Fisciano, Salerno, Italy (literal)
Titolo
  • Weak localization and 1/f noise in Nd1.83Ce0.17CuO4+? thin films (literal)
Abstract
  • We report on electrical transport measurements and voltage-noise analysis in unreduced Nd1.83Ce0.17CuO4+? thin films. At low temperatures ?T?100 K? the resistivity behavior is characterized by a metal-insulator crossover, which in these materials is usually interpreted in terms of weak localization induced by excess oxygen ions randomly distributed on apical impurity sites. The low-frequency voltage-spectral density reveals the presence of different conduction mechanisms in the metallic and in the insulating regions. Standard resistance fluctuations explain well the 1/f noise at temperatures above the resistance minimum while an unusual linear dependence of the 1/f noise on the applied bias current is found at lower temperatures, which could be interpreted as a signature of the occurrence of weak localization. (literal)
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