Emission-depth-selective Auger photoelectron coincidence spectroscopy (Articolo in rivista)

Type
Label
  • Emission-depth-selective Auger photoelectron coincidence spectroscopy (Articolo in rivista) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1103/PhysRevLett.94.038302 (literal)
Alternative label
  • Wolfgang SM Werner ; Smekal Werner ; Winter Hannspeter ; Störi Herbert ; Stefani Giovanni ; Ruocco Alessandro ; Offi Francesco ; Gotter Roberto ; Morgante Alberto ; Tommasini Fernando (2005)
    Emission-depth-selective Auger photoelectron coincidence spectroscopy
    in Physical review letters (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Wolfgang SM Werner ; Smekal Werner ; Winter Hannspeter ; Störi Herbert ; Stefani Giovanni ; Ruocco Alessandro ; Offi Francesco ; Gotter Roberto ; Morgante Alberto ; Tommasini Fernando (literal)
Pagina inizio
  • 038302 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 94 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 4 (literal)
Note
  • Scopu (literal)
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Wolfgang SM Werner (1); Smekal Werner (1); Winter Hannspeter (1); Störi Herbert (1); Stefani Giovanni (2); Ruocco Alessandro (2); Offi Francesco (2); Gotter Roberto (3); Morgante Alberto (3)(4); Tommasini Fernando (3)(4) (1) Institut fur Allgemeine Physik, Vienna University of Technology, Wiedner Hauptstraße 8-10, A-1040 Vienna, Austria (2) Dipartimento di Fisica and Unita` INFM, Universita` di Roma Tre, via della Vasca Navale 84, I-00146 Rome, Italy (3) Laboratorio Nazionale TASC-INFM, Area Science Park, SS14 km 163.5, I-34012 Trieste, Italy (4) Dipartimento di Fisica, Universita` di Trieste, via Valerio 2, I-34127 Trieste, Italy (literal)
Titolo
  • Emission-depth-selective Auger photoelectron coincidence spectroscopy (literal)
Abstract
  • The collision statistics of the energy dissipation of Auger and photoelectrons emitted from an amorphized Si(100) surface is studied by measuring the Si 2p photoelectron line as well as the first plasmon loss peak in coincidence with the Si-LVV Auger transition and the associated first plasmon loss. The Si 2p plasmon intensity decreases when measured in coincidence with the Si-LVV peak. If measured in coincidence with the Si-LVV plasmon the decrease is significantly smaller. The results agree quantitatively with calculations accounting for surface, volume, and intrinsic losses as well as elastic scattering in a random medium. In this way one can determine the average emission depth of individual electrons by means of Auger photoelectron coincidence spectroscopy, which therefore constitutes a unique tool to investigate interfaces at the nanoscale level. (literal)
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