Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2-ZrO2-TiO2 thin films (Articolo in rivista)

Type
Label
  • Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2-ZrO2-TiO2 thin films (Articolo in rivista) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1002/rcm.1014 (literal)
Alternative label
  • Barison S.; Barreca D., Battiston G.A,. Daolio S., Fabrizio M., Gerbasi R., Tondello E. (2003)
    Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2-ZrO2-TiO2 thin films
    in RCM. Rapid communications in mass spectrometry
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Barison S.; Barreca D., Battiston G.A,. Daolio S., Fabrizio M., Gerbasi R., Tondello E. (literal)
Pagina inizio
  • 996 (literal)
Pagina fine
  • 1001 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • IF 2.478 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 17 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1: Istituto per l'Energetica e le Interfasi, CNR, Padova 2: Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, Università di Padova, Centro di Studio sulla Stabilità e Reattività dei Composti di Coordinazione del CNR, Padova 3: Istituto di Chimica Inorganica e delle Superfici, CNR, Padova (literal)
Titolo
  • Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2-ZrO2-TiO2 thin films (literal)
Abstract
  • Mixed CeO2-ZrO2 systems have attracted a widespread interest for their use in three way catalysts (TWC) technology for automotive exhaust conversion into non-toxic products. In this work, CeO2-ZrO2 thin films were deposited via Chemical Vapor Deposition, in order to obtain nanoscale materials with a high surface-to-volume ratio, having a deep control of system properties. The addition of a buffer TiO2 thin film was also investigated. Cordierite was chosen as substrate, being the usual refractory material for catalytic mufflers. The multilayers were characterized by Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry. In particular, the combination of SIMS and XPS allowed to investigate both surface and in-depth chemical composition, studying also films intermixing phenomena induced by annealing processes. (literal)
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