http://www.cnr.it/ontology/cnr/individuo/prodotto/ID173641
Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2-ZrO2-TiO2 thin films (Articolo in rivista)
- Type
- Label
- Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2-ZrO2-TiO2 thin films (Articolo in rivista) (literal)
- Anno
- 2003-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1002/rcm.1014 (literal)
- Alternative label
Barison S.; Barreca D., Battiston G.A,. Daolio S., Fabrizio M., Gerbasi R., Tondello E. (2003)
Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2-ZrO2-TiO2 thin films
in RCM. Rapid communications in mass spectrometry
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Barison S.; Barreca D., Battiston G.A,. Daolio S., Fabrizio M., Gerbasi R., Tondello E. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1: Istituto per l'Energetica e le Interfasi, CNR, Padova
2: Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, Università di Padova, Centro di Studio sulla Stabilità e Reattività dei Composti di Coordinazione del CNR, Padova
3: Istituto di Chimica Inorganica e delle Superfici, CNR, Padova (literal)
- Titolo
- Secondary ion mass spectrometry and X-ray photoelectron spectroscopy investigation on chemical vapor deposited CeO2-ZrO2-TiO2 thin films (literal)
- Abstract
- Mixed CeO2-ZrO2 systems have attracted a widespread interest for their use in three way catalysts (TWC) technology for automotive exhaust conversion into non-toxic products. In this work, CeO2-ZrO2 thin films were deposited via Chemical Vapor Deposition, in order to obtain nanoscale materials with a high surface-to-volume ratio, having a deep control of system properties. The addition of a buffer TiO2 thin film was also investigated. Cordierite was chosen as substrate, being the usual refractory material for catalytic mufflers. The multilayers were characterized by Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry. In particular, the combination of SIMS and XPS allowed to investigate both surface and in-depth chemical composition, studying also films intermixing phenomena induced by annealing processes. (literal)
- Prodotto di
- Autore CNR
- Insieme di parole chiave
Incoming links:
- Prodotto
- Autore CNR di
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
- Insieme di parole chiave di