Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage (Contributo in atti di convegno)

Type
Label
  • Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage (Contributo in atti di convegno) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • Rapisarda M, Mariucci L, Valletta A, Pecora A, Fortunato G (2007)
    Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage
    in Proc. 3rd International TFT Conference ITC 2007 (Jan. 25-26, 2007, Roma) ISSN 1738-6047 pg. 176-179, roma
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Rapisarda M, Mariucci L, Valletta A, Pecora A, Fortunato G (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • Proc. 3rd International TFT Conference ITC 2007 (Jan. 25-26, 2007, Roma) ISSN 1738-6047 pg. 176-179 (literal)
Titolo
  • Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage (literal)
Prodotto di
Autore CNR

Incoming links:


Autore CNR di
Prodotto
data.CNR.it