http://www.cnr.it/ontology/cnr/individuo/prodotto/ID171740
Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage (Contributo in atti di convegno)
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- Label
- Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage (Contributo in atti di convegno) (literal)
- Anno
- 2007-01-01T00:00:00+01:00 (literal)
- Alternative label
Rapisarda M, Mariucci L, Valletta A, Pecora A, Fortunato G (2007)
Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage
in Proc. 3rd International TFT Conference ITC 2007 (Jan. 25-26, 2007, Roma) ISSN 1738-6047 pg. 176-179, roma
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Rapisarda M, Mariucci L, Valletta A, Pecora A, Fortunato G (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
- Proc. 3rd International TFT Conference ITC 2007 (Jan. 25-26, 2007, Roma) ISSN 1738-6047 pg. 176-179 (literal)
- Titolo
- Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage (literal)
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