Local Current Mapping and Patterning of Reduced Graphene Oxide (Articolo in rivista)

Type
Label
  • Local Current Mapping and Patterning of Reduced Graphene Oxide (Articolo in rivista) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1021/ja104567f (literal)
Alternative label
  • Mativetsky, JM (Mativetsky, Jeffrey M.); Treossi, E (Treossi, Emanuele); Orgiu, E (Orgiu, Emanuele); Melucci, M (Melucci, Manuela); Veronese, GP (Veronese, Giulio Paolo); Samori, P (Samori, Paolo); Palermo, V (Palermo, Vincenzo) (2010)
    Local Current Mapping and Patterning of Reduced Graphene Oxide
    in Journal of the American Chemical Society (Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Mativetsky, JM (Mativetsky, Jeffrey M.); Treossi, E (Treossi, Emanuele); Orgiu, E (Orgiu, Emanuele); Melucci, M (Melucci, Manuela); Veronese, GP (Veronese, Giulio Paolo); Samori, P (Samori, Paolo); Palermo, V (Palermo, Vincenzo) (literal)
Pagina inizio
  • 14130 (literal)
Pagina fine
  • 14136 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 132 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • DOI: 10.1021/ja104567f (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 40 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1. Nanochemistry Laboratory, ISIS - CNRS 7006, Universitè de Strasbourg, 8 alle Gaspard Monge, 67000 Strasbourg, France 2. Istituto per la Sintesi Organica e la Fotoreattività - Consiglio Nazionale delle Ricerche, via Gobetti 101, 40129 Bologna, Italy, 3. Istituto di Chimica dei Composti Organometallici - Consiglio Nazionale delle Ricerche, via Madonna del Piano 10, 50019 Sesto F.no (Fi), Italy, 4. Istituto per la Microelettronica e i Microsistemi - Consiglio Nazionale delle Ricerche, via Gobetti 101, 40129 Bologna, Italy (literal)
Titolo
  • Local Current Mapping and Patterning of Reduced Graphene Oxide (literal)
Abstract
  • Conductive atomic force microscopy (C-AFM) has been used to correlate the detailed structural and electrical characteristics of graphene derived from graphene oxide. Uniform large currents were measured over areas exceeding tens of micrometers in few-layer films, supporting the use of graphene as a transparent electrode material. Moreover, defects such as electrical discontinuities were easily detected. Multilayer films were found to have a higher conductivity per layer than single layers. It is also shown that a local AFM-tip-induced electrochemical reduction process can be used to pattern conductive pathways on otherwise-insulating graphene oxide. Transistors with micrometer-scale tip-reduced graphene channels that featured ambipolar transport and an 8 order of magnitude increase in current density upon reduction were successfully fabricated. (literal)
Prodotto di
Autore CNR

Incoming links:


Prodotto
Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
data.CNR.it