http://www.cnr.it/ontology/cnr/individuo/prodotto/ID171568
A measurement technique for thermoelectric power of CMOS layers at the wafer-level (Contributo in atti di convegno)
- Type
- Label
- A measurement technique for thermoelectric power of CMOS layers at the wafer-level (Contributo in atti di convegno) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Alternative label
Mancarella F, Roncaglia A, Passini M, Cardinali GC, Severi M (2005)
A measurement technique for thermoelectric power of CMOS layers at the wafer-level
in Eurosensors XIX, Barcelona (Spain)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Mancarella F, Roncaglia A, Passini M, Cardinali GC, Severi M (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- CNR IMM Bologna, I-40129 Bologna, Italy (literal)
- Titolo
- A measurement technique for thermoelectric power of CMOS layers at the wafer-level (literal)
- Prodotto di
- Autore CNR
Incoming links:
- Autore CNR di
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