http://www.cnr.it/ontology/cnr/individuo/prodotto/ID171330
X-rays and electrical characterizations of ordered mesostructurated silica thin films (Articolo in rivista)
- Type
- Label
- X-rays and electrical characterizations of ordered mesostructurated silica thin films (Articolo in rivista) (literal)
- Anno
- 2005-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.snb.2005.07.001 (literal)
- Alternative label
Bearzotti A., Generosi A., Mio Bertolo J., Palummo L., Rossi Albertini V. (2005)
X-rays and electrical characterizations of ordered mesostructurated silica thin films
in Sensors and actuators. B, Chemical (Print)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Bearzotti A., Generosi A., Mio Bertolo J., Palummo L., Rossi Albertini V. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.sciencedirect.com/science/article/pii/S0925400505006295 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
- http://dx.doi.org/10.1016/j.snb.2005.07.001 (literal)
- Note
- ISI Web of Science (WOS) (literal)
- Scopu (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- IMM-CNR
ISM-CNR (literal)
- Titolo
- X-rays and electrical characterizations of ordered mesostructurated silica thin films (literal)
- Abstract
- Mesoporous silica (MPS) thin films were characterized by X-ray analysis and electrical measurements to investigate possible correlation between structural order and best response of this kind of sensing material toward RH and alcohols vapours. Both energy dispersive X-ray diffraction and X-ray reflectometry results have been discussed to describe the ordered porosity distribution in the amorphous film. A phenomenological trend of the resistive-type sensors response changing calcination has been found and related to the change in the porosity order of MPS thin film. (literal)
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